Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김병호 | - |
dc.date.accessioned | 2018-03-20T23:58:49Z | - |
dc.date.available | 2018-03-20T23:58:49Z | - |
dc.date.issued | 2016-02 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v. 63, No. 2, Page. 121-125 | en_US |
dc.identifier.issn | 1549-7747 | - |
dc.identifier.issn | 1558-3791 | - |
dc.identifier.uri | http://ieeexplore.ieee.org/abstract/document/7277065/ | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/49827 | - |
dc.description.abstract | Lower cost test solutions are required to overcome high test cost issue of conventional characterization for the mixed-signal circuits, which is primarily caused by test equipment cost. This brief proposes a cost-effective self-characterization technique that accurately predicts the harmonics of individual mixed-signal circuits by dithering a loopback path with Gaussian-distributed noise. A set of scale factors is applied to the dithered root-mean-square noise. The different scale factors yield a corresponding change in the harmonic magnitudes of the loopback responses. Based on this, we derive a precise nonlinear loopback behaviormodel to quantitatively identify the harmonics of a device under test. The results show that the proposed method can be used for practical characterization. | en_US |
dc.description.sponsorship | This work was supported by the research fund of Hanyang University (HY-2014-N). This brief was recommended by Associate Editor V. Saxena. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.subject | Analog-to-digital converter (ADC) | en_US |
dc.subject | digital-toanalog converter (DAC) | en_US |
dc.subject | loopback test | en_US |
dc.subject | mixed-signal testing | en_US |
dc.subject | ANALOG | en_US |
dc.subject | CIRCUITS | en_US |
dc.title | Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications | en_US |
dc.type | Article | en_US |
dc.relation.no | 2 | - |
dc.relation.volume | 63 | - |
dc.identifier.doi | 10.1109/TCSII.2015.2482419 | - |
dc.relation.page | 121-125 | - |
dc.relation.journal | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | - |
dc.contributor.googleauthor | Kim, Byoungho | - |
dc.relation.code | 2016000229 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DIVISION OF ELECTRICAL ENGINEERING | - |
dc.identifier.pid | brandonkim | - |
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