Repository at Hanyang UniversityCOLLEGE OF ENGINEERING[S](공과대학)ELECTRONIC ENGINEERING(융합전자공학부)Articles
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dc.contributor.author박재근-
dc.date.accessioned2018-03-05T00:25:23Z-
dc.date.available2018-03-05T00:25:23Z-
dc.date.issued2013-10-
dc.identifier.citationApplied Physics Letters,2013,103.p183510en_US
dc.identifier.issn0003-6951-
dc.identifier.urihttp://dx.doi.org/10.1063/1.4828561-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/42040-
dc.descriptionMinistry of Trade, Industry and Energy (MI, Korea)en_US
dc.description.abstractWe describe abnormal dual bipolar resistive switching events in simple Pt/Ta2O5-x/TiOxNy and Pt/Ta2O5-x/TiN matrices in which the typical switching directions (SD) are initially clockwise (CW). The negative difference region in a high resistance state before reaching the typical "CW set" process enables the SD transition to a counterclockwise direction. It thereby emphasizes the occurrence of a highly stable secondary bipolar resistive switching curve. The origin of two different switching modes is described by adapting a bias-dependent oxygen ion accumulation and depletion process at TiOxNy and TiN electrode interfaces and by performing various structural analyses. (C) 2013 AIP Publishing LLC.en_US
dc.description.sponsorshipIndustrial Strategic Technology Development Programen_US
dc.language.isoenen_US
dc.publisherAMER INST PHYSICS, 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USAen_US
dc.subjectRESISTIVE SWITCHING MEMORIESen_US
dc.subjectTHIN-FILMSen_US
dc.subjectDEPOSITIONen_US
dc.subjectMECHANISMen_US
dc.subjectDEVICESen_US
dc.subjectLAYERen_US
dc.titleOxygen ion drift-driven dual bipolar hysteresis curves in a single Pt/Ta2O5-x/TiOxNy frameworken_US
dc.title.alternativeTa2O5-xen_US
dc.typeArticleen_US
dc.relation.no18-
dc.relation.volume103-
dc.identifier.doi10.1063/1.4828561-
dc.relation.page1-5-
dc.relation.journalAPPLIED PHYSICS LETTERS-
dc.contributor.googleauthorLee, Ah Rahm-
dc.contributor.googleauthorBae, Yoon Cheol-
dc.contributor.googleauthorBaek, Gwang Ho-
dc.contributor.googleauthorChung, Je Bock-
dc.contributor.googleauthorKang, Tae Sung-
dc.contributor.googleauthorLee, Jong Sun-
dc.contributor.googleauthorPark, Jea-Gun-
dc.contributor.googleauthorIm, Hyun Sik-
dc.contributor.googleauthorHong, Jin Pyo-
dc.relation.code2013008977-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidparkjgl-
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