| 2008-11 | A Mask Generation Approach to Double Patterning Technology with Inverse Lithography | 안일신 |
| 2008-11 | Patterning of 32 nm 1:1 Line and Space by Resist Reflow Process | 안일신 |
| 2008-10 | Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy | 김수은 |
| 2008-10 | Development of vacuum ultraviolet multichannel ellipsometry and its application to the characterization of ultrathin zirconium oxide films | 안일신 |
| 2008-09 | Optimum Biasing for 45nm Node Chromeless and Attenuated Phase Shift Mask | 안일신 |
| 2008-09 | Investigation of Laminated High-k Oxides by Using Vacuum Ultraviolet Spectroscopic Ellipsometry | 안일신 |
| 2008-08 | An Analytical Model of the Intracavity Optical Second Harmonic Generation in a Vertical-External-Cavity Surface-Emitting Laser | 심종인 |
| 2008-08 | Ellipsometry for Pellicle-Covered Surface | 안일신 |
| 2008-08 | Phase Transitions in the Two-Dimensional Quantum Rotor Model at Finite Temperature | 차민철 |
| 2008-06 | High-power and wavelength-tunable operation of an Er,Yb fiber laser using a volume Bragg grating | 김지원 |
| 2008-06 | Low-Detuning Operation of Electroabsorption Modulator as a Zero-Bias Optical Transceiver for Picocell Radio-Over-Fiber Applications | 심종인 |
| 2008-06 | Anisotropic resist reflow process simulation for 22 nm elongated contact holes | 안일신 |
| 2008-05 | A Method for Current Spreading Analysis and Electrode Pattern Design in Light Emitting Diodes (LEDs) | 심종인 |
| 2008-04 | Improved ESD voltage by inserting floating metal ring in GaN-based light emitting diodes | 심종인 |
| 2008-04 | High-power in-band pumped Er : YAG laser at 1617 nm | 김지원 |
| 2008-04 | Quantum Critical Phenomena with Broken Particle-Hole Symmetry | 차민철 |
| 2008-03 | An Embedded Wide-Band Spiral Inductor for 10 Gb/s Optical Transceiver Applications | 심종인 |
| 2008-02 | Phase Transitions in a Hard-Core Boson Model in Two Dimensions | 차민철 |
| 2008-02 | Correlation Functions at Quantum Criticality under Broken Time-Reversal Symmetry | 차민철 |
| 2008-02 | Ellipsometric inspection of the inner surface of pellicle-covered masks | 안일신 |
