73 0

Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy

Title
Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy
Author
김수은
Keywords
cantilevers; carbon nanotubes; ohmic contacts; scanning probe microscopy
Issue Date
2008-10
Publisher
AMER INST PHYSICS
Citation
REVIEW OF SCIENTIFIC INSTRUMENTS, v. 79, No. 10, Article no. 103702
Abstract
We demonstrate a simple method that uses a scanning electron microscope for making a reliable low resistance contact between a single multiwalled carbon nanotube and a metallic tungsten probe tip or a Si cantilever. This method consists of using electron beam induced decomposition of background gases and voltage pulses to remove contaminants. The electrical quality of the contact is monitored in situ by measuring the current flow at constant bias or by observing the decay of current fluctuations. The quality of the contacts is confirmed via current-voltage spectroscopy. This method produces very stable, low resistance, mechanically robust contacts with high success rates approaching 100%.
URI
https://aip.scitation.org/doi/abs/10.1063/1.2987696http://repository.hanyang.ac.kr/handle/20.500.11754/80711
ISSN
0034-6748
DOI
10.1063/1.2987696
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE