A novel fault detection circuit for short-circuit faults of IGBT
- Title
- A novel fault detection circuit for short-circuit faults of IGBT
- Author
- 김래영
- Keywords
- Insulated gate bipolar transistors; Logic gates; Fault detection; Electrical fault detection; Generators; Inductance
- Issue Date
- 2011-03
- Publisher
- IEEE
- Citation
- , Page. 359-363
- Abstract
- This paper proposed a novel fault detection circuit comparing the gate voltage of IGBT. The proposed scheme is operated to protect IGBT under short-circuit faults such as hard switch-fault (HSF). The proposed circuit consists of two parts. One is the difference generator which generates a difference between a gate voltage and an input voltage. The other is the short-circuit fault detector using a charged voltage of capacitor for short-circuit fault detection. The feasibility of the proposed short-circuit detecting scheme is verified by simulation results.
- URI
- http://ieeexplore.ieee.org/document/5744621/
- ISSN
- 1048-2334
- DOI
- 10.1109/APEC.2011.5744621
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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