Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김래영 | - |
dc.date.accessioned | 2018-02-03T06:42:45Z | - |
dc.date.available | 2018-02-03T06:42:45Z | - |
dc.date.issued | 2011-03 | - |
dc.identifier.citation | , Page. 359-363 | en_US |
dc.identifier.issn | 1048-2334 | - |
dc.identifier.uri | http://ieeexplore.ieee.org/document/5744621/ | - |
dc.description.abstract | This paper proposed a novel fault detection circuit comparing the gate voltage of IGBT. The proposed scheme is operated to protect IGBT under short-circuit faults such as hard switch-fault (HSF). The proposed circuit consists of two parts. One is the difference generator which generates a difference between a gate voltage and an input voltage. The other is the short-circuit fault detector using a charged voltage of capacitor for short-circuit fault detection. The feasibility of the proposed short-circuit detecting scheme is verified by simulation results. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.subject | Insulated gate bipolar transistors | en_US |
dc.subject | Logic gates | en_US |
dc.subject | Fault detection | en_US |
dc.subject | Electrical fault detection | en_US |
dc.subject | Generators | en_US |
dc.subject | Inductance | en_US |
dc.title | A novel fault detection circuit for short-circuit faults of IGBT | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/APEC.2011.5744621 | - |
dc.relation.page | 359-363 | - |
dc.contributor.googleauthor | Kim, Min Sub | - |
dc.contributor.googleauthor | Park, Byoung Gun | - |
dc.contributor.googleauthor | Kim, Rae Young | - |
dc.contributor.googleauthor | Hyun, Dong Seok | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING | - |
dc.identifier.pid | rykim | - |
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