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dc.contributor.author김정현-
dc.date.accessioned2024-04-03T07:08:30Z-
dc.date.available2024-04-03T07:08:30Z-
dc.date.issued2023-01-18-
dc.identifier.citationIEEE ACCESSen_US
dc.identifier.issn2169-3536en_US
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/10019273en_US
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/189572-
dc.description.abstractThis paper presents a fast switching and high-powered single-pole double-throw (SPDT) switch for RF switch circuits, such as TRx antenna switches and frequency band (or operation mode) selection switches in mobile handset applications. For fast switching time and performances of the RF switch, we proposed a novel method that can "selectively" control the impedance of a gate biasing circuit ("high" or "low" impedance). The proposed SPDT switch use the low impedance of the gate biasing circuit for fast switching time and use the high impedance of the gate biasing circuit to avoid the degradation of the insertion loss and harmonics. The proposed SPDT switch has no additional bias and no large payment for size consumption. According to measurement results, the turn-on switching time of the proposed SPDT switch was 0.35 mu s (at 2 GHz). The insertion loss, isolation, and return loss at 2 GHz were 0.16 dB, 47.1 dB, and 24 dB respectively. 2nd and 3rd harmonic levels at 25 dBm input power at 2 GHz were -88.7 dBm and -78.9 dBm, respectively. Power handling capability was 39.5 dBm of input power at 2 GHz. The designed SPDT switch was implemented in a 0.13-mu m partially depleted silicon-on-insulator (PD-SOI) process.en_US
dc.languageen_USen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.relation.ispartofseriesv. 11;7277-7282-
dc.subjectSwitchesen_US
dc.subjectLogic gatesen_US
dc.subjectSwitching circuitsen_US
dc.subjectRadio frequencyen_US
dc.subjectTransistorsen_US
dc.subjectResistorsen_US
dc.subjectImpedanceen_US
dc.titleHigh-Powered RF SOI Switch With Fast Switching Time for TDD Mobile Applicationsen_US
dc.typeArticleen_US
dc.relation.volume11-
dc.identifier.doi10.1109/ACCESS.2023.3237913en_US
dc.relation.page7277-7282-
dc.relation.journalIEEE ACCESS-
dc.contributor.googleauthorSeo, Wonwoo-
dc.contributor.googleauthorKim, Sunghyuk-
dc.contributor.googleauthorKo, Byunghun-
dc.contributor.googleauthorJhon, Heesauk-
dc.contributor.googleauthorKim, Junghyun-
dc.relation.code2023033690-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentSCHOOL OF ELECTRICAL ENGINEERING-
dc.identifier.pidjunhkim-


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