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Current status on the n/p type oxide semiconductor materials and the associated devices using atomic layer deposition

Title
Current status on the n/p type oxide semiconductor materials and the associated devices using atomic layer deposition
Author
박진성
Keywords
Atomic Layer Deposition (ALD); N-type; Oxide Semiconductor; P-type; Thin Film Transistor (TFT)
Issue Date
2021-12
Publisher
International Display Workshops
Citation
Proceedings of the International Display Workshops, v. 27, Page. 137-140
Abstract
Atomic Layer Deposition (ALD) has been introduced for oxide semiconductor synthesis and the device applications. Interestingly, ALD enable to deposit not only high-performance oxide semiconductor (a-IGZO etc.) but also p-type oxide semiconductors (CuO and SnO) at low deposition temperature. It will have a great potential to solve the current material and device issues. ALD will be the emerging thin film process in the coming display application.
URI
https://confit.atlas.jp/guide/organizer/idw/idw2020/subject/AMD1-01/search?searchType=only&initFlg=false&query=&title=Current+status+on+the+n%2Fp+type+oxide+semiconductor+materials+and+the+associated+devices+using+atomic+layer+deposition&author=&affiliation=https://repository.hanyang.ac.kr/handle/20.500.11754/178208
ISSN
1883-2490
DOI
10.36463/idw.2020.0137
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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