analog circuits; mixed-signal circuits; built-in self test (BIST); oscillation-test; signature analysis
Issue Date
2002-09
Publisher
대한전자공학회
Citation
Journal of Semiconductor Technology and Science, v. 2, no. 3, page. 226-232
Abstract
This paper explains a technique to improve the fault coverage of oscillation-test for linear analog circuits. The transient behavior of the virtual ground is monitored during oscillation to extract information of the circuit. The limitation is analyzed ,and an efficient signature analysis technique is proposed to maximize the fault coverage. The experimental result proves that the parametric fault coverage can be significantly increased by the proposed technique.