Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 노정진 | - |
dc.date.accessioned | 2021-01-25T05:36:16Z | - |
dc.date.available | 2021-01-25T05:36:16Z | - |
dc.date.issued | 2002-09 | - |
dc.identifier.citation | Journal of Semiconductor Technology and Science, v. 2, no. 3, page. 226-232 | en_US |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.issn | 2233-4866 | - |
dc.identifier.uri | http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE06514947 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/157444 | - |
dc.description.abstract | This paper explains a technique to improve the fault coverage of oscillation-test for linear analog circuits. The transient behavior of the virtual ground is monitored during oscillation to extract information of the circuit. The limitation is analyzed ,and an efficient signature analysis technique is proposed to maximize the fault coverage. The experimental result proves that the parametric fault coverage can be significantly increased by the proposed technique. | en_US |
dc.description.sponsorship | This work was supported by Hanyang University, Korea, made in the program year of 2001. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | 대한전자공학회 | en_US |
dc.subject | analog circuits | en_US |
dc.subject | mixed-signal circuits | en_US |
dc.subject | built-in self test (BIST) | en_US |
dc.subject | oscillation-test | en_US |
dc.subject | signature analysis | en_US |
dc.title | Virtual ground monitoring for high fault coverage of linear analog circuits | en_US |
dc.type | Article | en_US |
dc.relation.journal | 전자공학영문지 | - |
dc.contributor.googleauthor | Roh, Jeongjin | - |
dc.relation.code | 2012101086 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DIVISION OF ELECTRICAL ENGINEERING | - |
dc.identifier.pid | jroh | - |
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