Crosstalk과 정적 고장을 고려한 효과적인 연결선 테스트 알고리즘 및 BIST 구현

Abstract

his paper presents effective test patterns and their BIST implementations for SoC and Board interconnects. Initially '6n' algorithm, where ,n, is the total number of interconnect nets, is introduced to completely detect and diagnose both static and crosstalk faults. Then, more economic 'An+V algorithm is described to perfectly capture the crosstalk faults for the interconnect nets separated within a certain distance. It will be shown that both algorithms can be easily implemented as interconnect BIST hardwares with small area penalty than conventional LFSR