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A Mixed-Signal RISC-V Signal Analysis SoC Generator With a 16-nm FinFET Instance

Title
A Mixed-Signal RISC-V Signal Analysis SoC Generator With a 16-nm FinFET Instance
Author
한재덕
Keywords
Agile hardware design; analog-to-digital converter (ADC); CMOS; fast Fourier transform; filter; FinFET; generators; radar signal processing; spectrometer
Issue Date
2019-10
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE JOURNAL OF SOLID-STATE CIRCUITS, v. 54, no. 10, Page. 2786-2801
Abstract
This paper demonstrates a signal analysis system-on-chip (SoC) consisting of a general-purpose RISC-V core with vector extensions and a fixed-function signal-processing accelerator. Both the application core and the accelerators are design instances produced through an agile design-space exploration process by generators that allow for a wide range of parameter configurations. The signal processing chain consists of generated instances of a time-interleaved analog-to-digital converter (ADC) followed by a digital tuner, a finite-impulse response (FIR) filter, a polyphase filter, and a fast Fourier transform (FFT) all connected to the five-stage, in-order RISC-V Rocket processor via an AXI4 bus. The generator-based design methodology is detailed, along with the agile design process of producing the fabricated design instance. The 5 mm x 5 mm chip is implemented in a 16-nm FinFET process and operates at 410 MHz at 750 mV drawing 600 mW. Presented applications show coupled functionality of the application processor and accelerator performing spectrometry and radar receive processing, and a comparison with other state-of-the-art application-specific integrated circuits (ASICs) proves that generators can produce performance-competitive designs.
URI
https://ieeexplore.ieee.org/document/8765410https://repository.hanyang.ac.kr/handle/20.500.11754/152143
ISSN
0018-9200; 1558-173X
DOI
10.1109/JSSC.2019.2924090
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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