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dc.contributor.author한재덕-
dc.date.accessioned2020-08-10T06:58:59Z-
dc.date.available2020-08-10T06:58:59Z-
dc.date.issued2019-10-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v. 54, no. 10, Page. 2786-2801en_US
dc.identifier.issn0018-9200-
dc.identifier.issn1558-173X-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8765410-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/152143-
dc.description.abstractThis paper demonstrates a signal analysis system-on-chip (SoC) consisting of a general-purpose RISC-V core with vector extensions and a fixed-function signal-processing accelerator. Both the application core and the accelerators are design instances produced through an agile design-space exploration process by generators that allow for a wide range of parameter configurations. The signal processing chain consists of generated instances of a time-interleaved analog-to-digital converter (ADC) followed by a digital tuner, a finite-impulse response (FIR) filter, a polyphase filter, and a fast Fourier transform (FFT) all connected to the five-stage, in-order RISC-V Rocket processor via an AXI4 bus. The generator-based design methodology is detailed, along with the agile design process of producing the fabricated design instance. The 5 mm x 5 mm chip is implemented in a 16-nm FinFET process and operates at 410 MHz at 750 mV drawing 600 mW. Presented applications show coupled functionality of the application processor and accelerator performing spectrometry and radar receive processing, and a comparison with other state-of-the-art application-specific integrated circuits (ASICs) proves that generators can produce performance-competitive designs.en_US
dc.description.sponsorshipThis work was supported in part by the Defense Advanced Research Projects Agency (DARPA) through the Circuit Realization at Faster Timescales (CRAFT) Program under Grant HR0011-16-C0052, in part by the Berkeley Wireless Research Center (BWRC), and in part by the Berkeley Agile Design of Efficient Processing Technologies (ADEPT) lab (Intel iSTC). The views, opinions, and/or findings expressed are those of the author and should not be interpreted as representing the official views or policies of the Department of Defense or the U.S. Government.en_US
dc.language.isoenen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectAgile hardware designen_US
dc.subjectanalog-to-digital converter (ADC)en_US
dc.subjectCMOSen_US
dc.subjectfast Fourier transformen_US
dc.subjectfilteren_US
dc.subjectFinFETen_US
dc.subjectgeneratorsen_US
dc.subjectradar signal processingen_US
dc.subjectspectrometeren_US
dc.titleA Mixed-Signal RISC-V Signal Analysis SoC Generator With a 16-nm FinFET Instanceen_US
dc.typeArticleen_US
dc.relation.no10-
dc.relation.volume54-
dc.identifier.doi10.1109/JSSC.2019.2924090-
dc.relation.page2786-2801-
dc.relation.journalIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.contributor.googleauthorBailey, Steven-
dc.contributor.googleauthorRigge, Paul-
dc.contributor.googleauthorHan, Jaeduk-
dc.contributor.googleauthorLin, Richard-
dc.contributor.googleauthorChang, Eric Y.-
dc.contributor.googleauthorMao, Howard-
dc.contributor.googleauthorWang, Zhongkai-
dc.contributor.googleauthorMarkley, Chick-
dc.contributor.googleauthorIzraelevitz, Adam M.-
dc.contributor.googleauthorWang, Angie-
dc.relation.code2019001127-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidjdhan-
dc.identifier.orcidhttps://orcid.org/0000-0002-2292-7670-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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