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Design of Test Access Mechanism for AMBA Based System-on-a-Chip

Title
Design of Test Access Mechanism for AMBA Based System-on-a-Chip
Author
박성주
Issue Date
2007-05
Publisher
IEEE
Citation
25th IEEE VLSI Test Symposium (VTS'07), Page. 375-380
Abstract
A Test Interface Controller (TIC) provided by ARM Ltd. is widely used for functional testing of System-on-a-Chip (SoC) which adopts an Advanced Microcontroller Bus Architecture (AMBA) bus system. Unfortunately, this architecture has the deficiency of not being able to concurrently shift in and out the structural scan test patterns through the TIC and AMBA bus. This paper introduces a new AMBA based Test Access Mechanism (ATAM) for speedy testing of SoCs embedding ARM cores. Since scan-in and out operations can be performed simultaneously, test application time on the expensive Automatic Test Equipment (ATE) can be drastically reduced while preserving the compatibility with the ARM TIC.
URI
https://ieeexplore.ieee.org/document/4209941http://repository.hanyang.ac.kr/handle/20.500.11754/106530
ISSN
1093-0167; 2375-1053
DOI
10.1109/VTS.2007.25
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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