Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 심종인 | - |
dc.date.accessioned | 2019-01-25T06:12:16Z | - |
dc.date.available | 2019-01-25T06:12:16Z | - |
dc.date.issued | 2018-10 | - |
dc.identifier.citation | NANOPHOTONICS, v. 7, No. 10, Page. 1601-1615 | en_US |
dc.identifier.issn | 2192-8614 | - |
dc.identifier.uri | https://www.degruyter.com/view/j/nanoph.2018.7.issue-10/nanoph-2018-0094/nanoph-2018-0094.xml | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/81440 | - |
dc.description.abstract | For accurate and reliable measurement of the internal quantum efficiency (IQE) of light-emitting diodes (LEDs), the method should be theoretically solid and experimentally simple to use without any prior assumption of physical parameters or complicated equipment. In this paper, we critically review the conventional characterization techniques for measuring the IQE of LEDs, including the methods based on temperature-dependent electroluminescence and constant AB(C) models. After reviewing the limitations of the existing IQE measurement techniques, we present the recently proposed method based on the improved AB model, called room-temperature reference-point method (RTRM). The RTRM is then applied to various LED devices to show how the IQE measurement techniques can be utilized to analyze their optoelectronic performances quantitatively. | en_US |
dc.description.sponsorship | This work was supported by the Technology Innovation Program (Grant 10065712) funded by the Ministry of Trade, Industry and Energy, Republic of Korea. The authors are grateful to Dr. Dong-Pyo Han, Mr. Chan-Hyoung Oh of Hanyang University, and Dr. Hyundon Jung of EtaMax for their useful discussions and experimental help. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | WALTER DE GRUYTER GMBH | en_US |
dc.subject | light-emitting diodes | en_US |
dc.subject | internal quantum efficiency | en_US |
dc.subject | characterization | en_US |
dc.subject | LEDS | en_US |
dc.title | Measuring the internal quantum efficiency of light-emitting diodes: towards accurate and reliable room-temperature characterization | en_US |
dc.type | Article | en_US |
dc.relation.no | 10 | - |
dc.relation.volume | 7 | - |
dc.identifier.doi | 10.1515/nanoph-2018-0094 | - |
dc.relation.page | 1601-1615 | - |
dc.relation.journal | NANOPHOTONICS | - |
dc.contributor.googleauthor | Shim, Jong-In | - |
dc.contributor.googleauthor | Shin, Dong-Soo | - |
dc.relation.code | 2018006299 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E] | - |
dc.sector.department | DEPARTMENT OF PHOTONICS AND NANOELECTRONICS | - |
dc.identifier.pid | jishim | - |
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