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dc.contributor.author임창환-
dc.date.accessioned2018-08-09T01:37:07Z-
dc.date.available2018-08-09T01:37:07Z-
dc.date.issued2016-07-
dc.identifier.citationSCHIZOPHRENIA RESEARCH, v. 176, NO 2-3, Page. 314-319en_US
dc.identifier.issn0920-9964-
dc.identifier.issn1573-2509-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0920996416302274?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/74386-
dc.description.abstractRecently, an increasing number of researchers have endeavored to develop practical tools for diagnosing patients with schizophrenia using machine learning techniques applied to EEG biomarkers. Although a number of studies showed that source-level EEG features can potentially be applied to the differential diagnosis of schizophrenia, most studies have used only sensor-level EEG features such as ERP peak amplitude and power spectrum for machine learning-based diagnosis of schizophrenia. In this study, we used both sensor-level and source-level features extracted from EEG signals recorded during an auditory oddball task for the classification of patients with schizophrenia and healthy controls. EEG signals were recorded from 34 patients with schizophrenia and 34 healthy controls while each subject was asked to attend to oddball tones. Our results demonstrated higher classification accuracy when source-level features were used together with sensor-level features, compared to when only sensor-level features were used. In addition, the selected sensor-level features were mostly found in the frontal area, and the selected source-level features were mostly extracted from the temporal area, which coincide well with the well-known pathological region of cognitive processing in patients with schizophrenia. Our results suggest that our approach would be a promising tool for the computer-aided diagnosis of schizophrenia. (C) 2016 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipThis research was supported in part by the Brain Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning (NRF-2015M3C7A1031969) and in part by the National Research Foundation of Korea (NRF) grants funded by the Korean Government (MSIP) (Nos. 2015R1A2A1A15054662 and NRF-2015R1A5A7037676).en_US
dc.language.isoenen_US
dc.publisherELSEVIER SCIENCE BVen_US
dc.subjectSchizophreniaen_US
dc.subjectEvent-related potential (ERP)en_US
dc.subjectMachine learningen_US
dc.subjectSource-level featuresen_US
dc.subjectComputer-aided diagnosisen_US
dc.titleMachine-learning-based diagnosis of schizophrenia using combined sensor-level and source-level EEG featuresen_US
dc.typeArticleen_US
dc.relation.no2-3-
dc.relation.volume176-
dc.identifier.doi10.1016/j.schres.2016.05.007-
dc.relation.page314-319-
dc.relation.journalSCHIZOPHRENIA RESEARCH-
dc.contributor.googleauthorShim, Miseon-
dc.contributor.googleauthorHwang, Han-Jeong-
dc.contributor.googleauthorKim, Do-Won-
dc.contributor.googleauthorLee, Seung-Hwan-
dc.contributor.googleauthorIm, Chang-Hwan-
dc.relation.code2016001405-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING-
dc.identifier.pidich-
dc.identifier.orcidhttp://orcid.org/0000-0003-3795-3318-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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