Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 윤동원 | - |
dc.date.accessioned | 2018-07-25T01:56:16Z | - |
dc.date.available | 2018-07-25T01:56:16Z | - |
dc.date.issued | 2011-05 | - |
dc.identifier.citation | IEEE Transactions on Vehicular Technology IEEE Trans. Veh. Technol. Vehicular Technology, IEEE Transactions on. 60(4):1916-1924 May, 2011 | en_US |
dc.identifier.issn | 0018-9545 | - |
dc.identifier.issn | 1939-9359 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/5713852/ | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/72822 | - |
dc.description.abstract | This paper provides a new, exact, and general expression involving 1-D and 2-D Q-functions for the bit error probability of M-ary phase-shift keying (MPSK) under additive white Gaussian noise (AWGN) and fading channels when Gray code bit mapping is employed. Regular patterns in the error probability expression of the kth bit are observed while developing the bit error rate (BER) expression. From these patterns, we then derive a new BER expression for the MPSK constellation. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.subject | Bit error probability | en_US |
dc.subject | gray coding | en_US |
dc.subject | M-ary phase-shift keying (MPSK) | en_US |
dc.title | New BER Expression of MPSK | en_US |
dc.type | Article | en_US |
dc.relation.no | 4 | - |
dc.relation.volume | 60 | - |
dc.identifier.doi | 10.1109/TVT.2011.2114903 | - |
dc.relation.page | 1916-1924 | - |
dc.relation.journal | IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY | - |
dc.contributor.googleauthor | Jeong, Woojin | - |
dc.contributor.googleauthor | Lee, Jaeyoon | - |
dc.contributor.googleauthor | Yoon, Dongweon | - |
dc.relation.code | 2011203902 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | dwyoon | - |
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