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dc.contributor.author김동규-
dc.date.accessioned2018-07-25T00:48:38Z-
dc.date.available2018-07-25T00:48:38Z-
dc.date.issued2011-03-
dc.identifier.citationAnalog Integrated Circuits and Signal Processing,Vol.66 No.3 [2011],467-474en_US
dc.identifier.issn0925-1030-
dc.identifier.urihttp://link.springer.com/article/10.1007%2Fs10470-010-9563-8-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/72785-
dc.description.abstractA physical unclonable function (PUF) based on process variations on silicon wafers is a very promising technology which finds various applications in identification and authentication, but only a few integrated circuits have been reported so far. As those circuits are vulnerable to power supply noises, switching noises and environmental variations, they lead to a reliability issue such as time-varying or metastable responses. To resolve this issue, this letter proposes a new integrated circuit design for PUFs using differential amplifiers. The feasibility of the proposed circuit has been theoretically analyzed and validated through HSPICE simulations for the previous and proposed circuits.en_US
dc.description.sponsorshipThis work was supported by the Research Fund of Hanyang University (HY-2006).en_US
dc.language.isoenen_US
dc.publisherSPRINGER, VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDSen_US
dc.subjectPhysical unclonable functionen_US
dc.subjectProcess variationen_US
dc.subjectDifferential amplifieren_US
dc.subjectIdentificationen_US
dc.subjectAuthenticationen_US
dc.titleIntegrated circuit design for physical unclonable function using differential amplifiersen_US
dc.typeArticleen_US
dc.relation.no3-
dc.relation.volume66-
dc.identifier.doi10.1007/s10470-010-9563-8-
dc.relation.page467-474-
dc.relation.journalANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING-
dc.contributor.googleauthorChoi, Byong-Deok-
dc.contributor.googleauthorKim, Tae-Wook-
dc.contributor.googleauthorLee, Mun-Kyu-
dc.contributor.googleauthorChung, Ki-Seok-
dc.contributor.googleauthorKim, Dong Kyue-
dc.relation.code2011200591-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.piddqkim-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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