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dc.contributor.author좌용호-
dc.date.accessioned2018-05-29T02:49:07Z-
dc.date.available2018-05-29T02:49:07Z-
dc.date.issued2017-01-
dc.identifier.citationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v. 164, No. 2, Page. 82-87en_US
dc.identifier.issn0013-4651-
dc.identifier.issn1945-7111-
dc.identifier.urihttp://jes.ecsdl.org/content/164/2/D82.short-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/71602-
dc.description.abstractCompact semiconducting tellurium thick films (i.e., upto 50 mu m) were electrodeposited at high rates (>100 mu m h(-1)) with great current efficiency (>85%) by optimizing the electrolyte composition (TeO32- concentration and pH) and deposition potential. The preferred orientation of as-deposited Te films changed from (001) to (101) direction as the deposition potential becomes more cathodic. Average grain size ranged from 66 to 135 nm depending the deposition parameters. Electrodeposited Te films were p-type semiconductors with the carrier concentration ranged from similar to 7.0 x 10(18) to similar to 3.1 x 10(19) cm(-3). The carrier concentration of Te films strongly dependent on the average grain size where larger average grain size resulted in a lower carrier concentration because of less structural defects. (C) 2017 The Electrochemical Society. All rights reserved.en_US
dc.description.sponsorshipThis research was supported by a grant the Korea Institute of Industrial Technology (KITECH) and the Fundamental R&D Program for Core Technology of Materials funded by the Ministry of Knowledge Economy, Republic of Korea.en_US
dc.language.isoen_USen_US
dc.publisherELECTROCHEMICAL SOC INCen_US
dc.subjectGALVANIC DISPLACEMENT REACTIONen_US
dc.subjectATOMIC LAYERSen_US
dc.subjectPHASE-TRANSITIONSen_US
dc.subjectGOLD ELECTRODESen_US
dc.subjectTEen_US
dc.subjectPOLAROGRAPHYen_US
dc.subjectNANOWIRESen_US
dc.subjectAU(111)en_US
dc.subjectAU(100)en_US
dc.subjectGROWTHen_US
dc.titleElectrodeposition of Compact Tellurium Thick Films from Alkaline Bathsen_US
dc.typeArticleen_US
dc.relation.no2-
dc.relation.volume164-
dc.identifier.doi10.1149/2.1191702jes-
dc.relation.page82-87-
dc.relation.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.contributor.googleauthorWu, Tingjun-
dc.contributor.googleauthorZhang, Miluo-
dc.contributor.googleauthorLee, Kyu-Hwan-
dc.contributor.googleauthorLee, Chang-Myoun-
dc.contributor.googleauthorLee, Hong-Kee-
dc.contributor.googleauthorChoa, Yongho-
dc.contributor.googleauthorMyung, Nosang V-
dc.relation.code2017002437-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING-
dc.identifier.pidchoa15-
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COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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