Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권오경 | - |
dc.date.accessioned | 2018-04-19T22:59:36Z | - |
dc.date.available | 2018-04-19T22:59:36Z | - |
dc.date.issued | 2011-03 | - |
dc.identifier.citation | Japanese Journal of Applied Physics, 2011, 50(3) | en_US |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | http://iopscience.iop.org/article/10.1143/JJAP.50.03CC01/meta | - |
dc.description.abstract | In this paper, we propose a driving method for compensating the electrical instability of hydrogenated amorphous silicon (a-Si: H) thin film transistors (TFTs) and the luminance degradation of organic light-emitting diode (OLED) devices for large active matrix OLED (AMOLED) displays. The proposed driving method senses the electrical characteristics of a-Si: H TFTs and OLEDs using current integrators and compensates them by an external compensation method. Threshold voltage shift is controlled a using negative bias voltage. After applying the proposed driving method, the measured error of the maximum emission current ranges from -1.23 to +1.59 least significant bit (LSB) of a 10-bit gray scale under the threshold voltage shift ranging from -0.16 to 0.17 V. (c) 2011 The Japan Society of Applied Physics | en_US |
dc.description.sponsorship | This research was supported by a grant (F0004060) from the Information Display R&D Center, one of the Knowledge Economy Frontier R&D programs funded by the Ministry of Knowledge Economy of the Korean government. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IOP Publishing LTD | en_US |
dc.subject | AMOLED DISPLAYS | en_US |
dc.subject | DEGRADATION | en_US |
dc.subject | DEVICES | en_US |
dc.subject | TIME | en_US |
dc.title | Driving Method for Compensating Reliability Problem of Hydrogenated Amorphous Silicon Thin Film Transistors and Image Sticking Phenomenon in Active Matrix Organic Light-Emitting Diode Displays | en_US |
dc.type | Article | en_US |
dc.relation.volume | 50 | - |
dc.identifier.doi | 10.1143/JJAP.50.03CC01 | - |
dc.relation.page | 1-1 | - |
dc.relation.journal | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.contributor.googleauthor | Shin, MS | - |
dc.contributor.googleauthor | Jo, YR | - |
dc.contributor.googleauthor | Kwon, OK | - |
dc.relation.code | 2011217131 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | okwon | - |
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