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dc.contributor.author윤상원-
dc.date.accessioned2018-04-19T11:55:58Z-
dc.date.available2018-04-19T11:55:58Z-
dc.date.issued2013-01-
dc.identifier.citationJournal of Micromechanics and Microengineering, 2012, 23(1), 015017en_US
dc.identifier.issn0960-1317-
dc.identifier.urihttp://iopscience.iop.org/article/10.1088/0960-1317/23/1/015017-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/69833-
dc.description.abstractThis paper presents the feasibility of highly reliable and repeatable copper-tin transient liquid phase (Cu-Sn TLP) bonding as applied to die attachment in high temperature operational power modules. Electrified vehicles are attracting particular interest as eco-friendly vehicles, but their power modules are challenged because of increasing power densities which lead to high temperatures. Such high temperature operation addresses the importance of advanced bonding technology that is highly reliable (for high temperature operation) and repeatable (for fabrication of advanced structures). Cu-Sn TLP bonding is employed herein because of its high remelting temperature and desirable thermal and electrical conductivities. The bonding starts with a stack of Cu-Sn-Cu metal layers that eventually transforms to Cu-Sn alloys. As the alloys have melting temperatures (Cu3Sn: > 600 degrees C, Cu6Sn5: > 400 degrees C) significantly higher than the process temperature, the process can be repeated without damaging previously bonded layers. A Cu-Sn TLP bonding process was developed using thin Sn metal sheets inserted between copper layers on silicon die and direct bonded copper substrates, emulating the process used to construct automotive power modules. Bond quality is characterized using (1) proof-of-concept fabrication, (2) material identification using scanning electron microscopy and energy-dispersive x-ray spectroscopy analysis, and (3) optical analysis using optical microscopy and scanning acoustic microscope. The feasibility of multiple-sided Cu-Sn TLP bonding is demonstrated by the absence of bondline damage in multiple test samples fabricated with double-or four-sided bonding using the TLP bonding process.en_US
dc.language.isoenen_US
dc.publisherIOP Publishing LTDen_US
dc.subjectDEVICESen_US
dc.subjectTINen_US
dc.titleReliable and repeatable bonding technology for high temperature automotive power modules for electrified vehiclesen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume23-
dc.identifier.doi10.1088/0960-1317/23/1/015017-
dc.relation.page015017-15028-
dc.relation.journalJOURNAL OF MICROMECHANICS AND MICROENGINEERING-
dc.contributor.googleauthorYoon, S.W.-
dc.contributor.googleauthorGlover, M.D.-
dc.contributor.googleauthorMantooth, H.A.-
dc.contributor.googleauthorShiozaki, K.-
dc.relation.code2013010809-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF AUTOMOTIVE ENGINEERING-
dc.identifier.pidswyoon-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > AUTOMOTIVE ENGINEERING(미래자동차공학과) > Articles
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