Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 장재영 | - |
dc.date.accessioned | 2018-04-19T07:56:43Z | - |
dc.date.available | 2018-04-19T07:56:43Z | - |
dc.date.issued | 2012-03 | - |
dc.identifier.citation | Applied Physics Letters, 2012, 100(10), 102110 | en_US |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://aip.scitation.org/doi/10.1063/1.3691920 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/69496 | - |
dc.description.abstract | We investigated the influence of organic dielectric surfaces on the electrical characteristics of inorganic amorphous indium-gallium-zinc oxide (a-IGZO)-based thin film transistors (TFTs). To modify the dielectric surface, various self-assembled monolayers and polymer thin films with different functional groups were introduced. Electrical measurements of the a-IGZO TFTs using surface-modified gate dielectrics revealed that the threshold voltages shifted toward positive values as the surface functional groups attract more electrons in the a-IGZO thin films. These results indicate that the channel conductance and carrier density of a-IGZO TFTs could be tuned by simple modification of the dielectric surfaces with organic materials. (C) 2012 American Institute of Physics. [http://dx.doi.org.access.hanyang.ac.kr/10.1063/1.3691920] | en_US |
dc.description.sponsorship | The XRD experiments were performed at the 10C1 beamline (wavelength similar to 1.54 angstrom) of the Pohang Accelerator Laboratory in Korea. This work was supported by a grant from the Strategic Technology under the Ministry of Knowledge Economy (MKE); a grant from the Korea Science and Engineering Foundation (KOSEF) funded by the Korea government (MEST) (20110000330) and also by a grant from LG Chem, Ltd. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Amer Physical SOC | en_US |
dc.subject | SELF-ASSEMBLED MONOLAYERS | en_US |
dc.subject | FIELD-EFFECT TRANSISTORS | en_US |
dc.subject | OXIDE SEMICONDUCTORS | en_US |
dc.title | The effects of organic material-treated SiO2 dielectric surfaces on the electrical characteristics of inorganic amorphous In-Ga-Zn-O thin film transistors | en_US |
dc.type | Article | en_US |
dc.relation.no | 10 | - |
dc.relation.volume | 100 | - |
dc.identifier.doi | 10.1063/1.3691920 | - |
dc.relation.page | 1-5 | - |
dc.relation.journal | APPLIED PHYSICS LETTERS | - |
dc.contributor.googleauthor | Park, Mijeong | - |
dc.contributor.googleauthor | Jang, Jaeyoung | - |
dc.contributor.googleauthor | Park, Seonuk | - |
dc.contributor.googleauthor | Kim, Jiye | - |
dc.contributor.googleauthor | Park, Chan Eon | - |
dc.contributor.googleauthor | Seong, Jiehyun | - |
dc.contributor.googleauthor | Hwang, Jiyoung | - |
dc.relation.code | 2012200866 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ENERGY ENGINEERING | - |
dc.identifier.pid | jyjang15 | - |
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