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dc.contributor.author권오경-
dc.date.accessioned2018-04-16T04:26:21Z-
dc.date.available2018-04-16T04:26:21Z-
dc.date.issued2012-03-
dc.identifier.citationIEEE Transactions on Nanotechnology, 2012 11(2), P.386-389en_US
dc.identifier.issn1536-125X-
dc.identifier.urihttps://ieeexplore.ieee.org/document/6082447/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/67849-
dc.description.abstractIdeal nanowire transistors exhibit saturation and square-law behavior in their output characteristics. The current saturation above the pinch-off voltage is an essential characteristic for transistors to be applied to a display device that is required to produce a consistent level of brightness even during long operation periods. However, fabricated oxide nanowire transistors exhibit three representative output characteristics-metallic, linearly increasing, and saturated curves-within ameasurable range. In this study, through experiments and simulations using In2O3 nanowire transistors, we show that fewer oxygen vacancies in the nanowire produce output characteristics more similar to ideal MOSFET characteristics. This result indicates that differences in electrical characteristics of the nanowire transistor are derived from the difference in the number of oxygen vacancies in the oxide nanowire.en_US
dc.description.sponsorshipManuscript received August 1, 2011; accepted November 2, 2011. Date of publication November 16, 2011; date of current version March 9, 2012. This work was supported by the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology under Grant 2011-0019133 and Grant 2011K000627. The review of this paper was arranged by Associate Editor C. Zhou.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectNanowireen_US
dc.subjectoutput characteristicsen_US
dc.subjectsaturationen_US
dc.subjectsquare lawen_US
dc.subjecttransistoren_US
dc.titleMetallic, Linear, and Saturated Output Characteristics of Oxide Nanowire Transistorsen_US
dc.typeArticleen_US
dc.relation.no2-
dc.relation.volume11-
dc.identifier.doi10.1109/TNANO.2011.2175404-
dc.relation.page386-389-
dc.relation.journalIEEE TRANSACTIONS ON NANOTECHNOLOGY-
dc.contributor.googleauthorKim, H.-
dc.contributor.googleauthorKwag, P.-S.-
dc.contributor.googleauthorLee, S.-
dc.contributor.googleauthorKwon, O.-K.-
dc.contributor.googleauthorJu, S.-
dc.relation.code2012214111-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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