A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs
- Title
- A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs
- Author
- 권오경
- Keywords
- Depletion mode; In-Ga-Zn-O; scan driver; thin-film transistor (TFT)
- Issue Date
- 2012-03
- Publisher
- IEEE
- Citation
- IEEE Electron Device Letters, 2012, 33(3), P.402-404
- Abstract
- A new low-power scan driver using amorphous In-Ga-Zn-O (a-IGZO) thin-film transistor (TFT) is proposed. The proposed scan driver employs only one-clock signal and connects power supply voltage to the drain node of pull-up TFTs in the output stage to reduce the power consumption. The measured power consumption of the proposed scan driver of ten stages is 265 mu W at an output voltage of 20 V and a clock frequency of 46.1 kHz, which is the driving condition of the extended graphics array (1024 x 768) panel. The power consumption is less than 11.9% of the previously reported results.
- URI
- https://ieeexplore.ieee.org/document/6151012/http://hdl.handle.net/20.500.11754/67844
- ISSN
- 0741-3106
- DOI
- 10.1109/LED.2011.2181482
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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