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dc.contributor.author권오경-
dc.date.accessioned2018-04-16T01:39:04Z-
dc.date.available2018-04-16T01:39:04Z-
dc.date.issued2012-06-
dc.identifier.citationSID Symposium Digest of Technical Papers, 2012, 43(1), P.1108-1111(4)en_US
dc.identifier.issn0097-966X-
dc.identifier.urihttp://onlinelibrary.wiley.com/doi/abs/10.1002/j.2168-0159.2012.tb05986.x-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/67330-
dc.description.abstractThis paper presents a low‐power and small‐sized scan driver using amorphous indium‐gallium‐zinc‐oxide (a‐IGZO) thin‐film transistors (TFTs). Power consumption of the proposed scan driver is reduced by eliminating unnecessary charging current of the scan line and reducing the voltage swing of clock signals. In the proposed scan driver, area of the output stage, which requires large‐sized driving TFTs, is also reduced by merging TFTs for charging and discharging the scan line into one TFT and using non‐overlapping clock signals. Compared to the previous scan driver, power consumption and area of the output stage of the proposed scan driver is reduced by 21% and 40%, respectively. The proposed scan driver has power consumption of 27.4 μW per stage at the operating frequency of 46 kHz and the area per stage is 1153 × 192 μm2.en_US
dc.language.isoenen_US
dc.publisherWiley-Blackwellen_US
dc.subjectTHIN film transistorsen_US
dc.subjectAMORPHOUS semiconductorsen_US
dc.subjectINDIUM gallium zinc oxideen_US
dc.subjectAMORPHOUS substancesen_US
dc.subjectENERGY consumptionen_US
dc.titleLow-Power and Small-Sized Scan Driver Using Amorphous Oxide TFTsen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume50-
dc.identifier.doi10.1002/j.2168-0159.2012.tb05986.x-
dc.relation.page1108-1111-
dc.contributor.googleauthorHong, S.-J.-
dc.contributor.googleauthorKang, J.-S.-
dc.contributor.googleauthorLee, C.-H.-
dc.contributor.googleauthorKwon, O.-K.-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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