Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김동규 | - |
dc.date.accessioned | 2018-03-23T01:46:32Z | - |
dc.date.available | 2018-03-23T01:46:32Z | - |
dc.date.issued | 2014-04 | - |
dc.identifier.citation | Nonlinear Theory and Its Applications, IEICE. 2014, 5, 2, 101-112 | en_US |
dc.identifier.issn | 2185-4106 | - |
dc.identifier.uri | https://www.jstage.jst.go.jp/article/nolta/5/2/5_101/_article/-char/ja/ | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/51018 | - |
dc.description.abstract | PUFs, that self-generate random numbers, are used in identification or authentication applications for two reasons: cost and security. Since the randomness of PUFs in individual chips may differ, PUFs in some chips may generate somewhat less than random values. Defects during manufacturing may also affect the randomness of PUFs. In either case, confidential information based on PUFs could be vulnerable to security threats. Thus, it is necessary to identify both failing chips during manufacturing and PUFs which are not sufficiently random. To test the randomness of PUFs in a chip, we have designed a dedicated random test module optimized for hardware implementation. Finally, by implementing the module in real PUFs, we verified its validity. | en_US |
dc.language.iso | en | en_US |
dc.publisher | 一般社?法人 電子情報通信?? / The Institute of Electronics, Information and Communication Engineers | en_US |
dc.title | Built-in hardware pseudo-random test module for physical unclonable functions | en_US |
dc.type | Article | en_US |
dc.relation.no | 3 | - |
dc.relation.volume | 2 | - |
dc.identifier.doi | 10.1587/nolta.5.101 | - |
dc.relation.page | 1101-1112 | - |
dc.relation.journal | The Transactions of the IEICE B(電子情報通信學會論文誌B) | - |
dc.contributor.googleauthor | Lee, Jae Seong | - |
dc.contributor.googleauthor | Choi, Piljoo | - |
dc.contributor.googleauthor | Kim, Song-Ju | - |
dc.contributor.googleauthor | Choi, Byong-Deok | - |
dc.contributor.googleauthor | Kim, Dong Kyue | - |
dc.relation.code | 2012211704 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | dqkim | - |
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