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Roughness-based monitoring of transparency and conductivity in boron-doped ZnO thin films prepared by spray pyrolysis

Title
Roughness-based monitoring of transparency and conductivity in boron-doped ZnO thin films prepared by spray pyrolysis
Author
한성환
Keywords
Thin films; Optical materials; Chemical synthesis; X-ray diffraction
Issue Date
2012-12
Publisher
Elsevier Science B.V., Amsterdam.
Citation
Materials research bulletin, 2012, 47(12), P.4257-4262
Abstract
Sprayed polycrystalline ZnO and boron-doped ZnO thin films composed of spherical grains of 25-32 nm in diameters are used in roughness measurement and further correlated with the transparency and the conductivity characteristics. The surface roughness is increased up to Zn0.98B0.02O and then declined at higher boron concentrations. The sprayed ZnO films revealed >= 95% transmittance in the visible wavelength range, 1.956 x 10(-4) Omega cm electrical resistivity, 46 cm(2)/V s Hall mobility and 9.21 x 10(21) cm(-3) charge carrier concentration. The X-ray photoelectron spectroscopy study has confirmed 0.15 eV binding energy change for Zn 2p(3/2) when 2 at% boron content is mixed without altering electro-optical properties substantially. Finally, using soft modeling importance of these textured ZnO over non-textured films for enhancing the solar cells performance is explored. (C) 2012 Elsevier Ltd. All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S0025540812006873?via%3Dihubhttp://hdl.handle.net/20.500.11754/51005
ISSN
0025-5408; 1873-4227
DOI
10.1016/j.materresbull.2012.09.022
Appears in Collections:
COLLEGE OF NATURAL SCIENCES[S](자연과학대학) > CHEMISTRY(화학과) > Articles
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