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dc.contributor.author유창식-
dc.date.accessioned2018-03-23T00:43:31Z-
dc.date.available2018-03-23T00:43:31Z-
dc.date.issued2013-11-
dc.identifier.citationIEEE Transactions on VLSI System, 2013, 21(11), P.2155-2159en_US
dc.identifier.issn1063-8210-
dc.identifier.urihttps://ieeexplore.ieee.org/document/6389783/-
dc.description.abstractThe interpin skew among the data and the strobe signals of a source-synchronous parallel DRAM interface is compensated by a simple delay-locked loop, which reuses the circuitry of a normal input data path. With the interpin skew compensation, the printed circuit board traces of the data and the strobe signals are allowed to have unequal length. The prototype implemented in a 0.13-mu m standard CMOS process shows that the interpin skew is reduced to be less than 26 ps for a 3.2-Gb/s/pin x8 parallel interface.en_US
dc.description.sponsorshipThis work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by MEST (2010-0012551) and the IT R&D Program of MKE/KEIT (Large-Scale Hyper-MLC SSD Technology Development, under Grant 10035202) of Korea.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectCMOSen_US
dc.subjectdelay-locked loop (DLL)en_US
dc.subjectinterpin skew compensationen_US
dc.subjectparallel interfaceen_US
dc.subjectsynchronous DRAM (SDRAM)en_US
dc.titleSkew Compensation Technique for Source-Synchronous Parallel DRAM Interfaceen_US
dc.typeArticleen_US
dc.relation.volume21-
dc.identifier.doi10.1109/TVLSI.2012.2227853-
dc.relation.page2155-2159-
dc.relation.journalIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-
dc.contributor.googleauthorLee, Jang-Woo-
dc.contributor.googleauthorKim, Hong-Jung-
dc.contributor.googleauthorJeong, Chun-Seok-
dc.contributor.googleauthorLee, Jae-Jin-
dc.contributor.googleauthorYoo, Changsik-
dc.relation.code2013003600-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidcsyoo-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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