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dc.contributor.author정정화-
dc.date.accessioned2018-03-16T00:23:53Z-
dc.date.available2018-03-16T00:23:53Z-
dc.date.issued2014-08-
dc.identifier.citationETRI Journal, 2014, 36(4), p643-653en_US
dc.identifier.issn1225-6463-
dc.identifier.urihttp://onlinelibrary.wiley.com/doi/10.4218/etrij.14.0113.1233/abstract-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/47555-
dc.description.abstractTo reduce interconnect delay and power consumption while improving chip performance, a three-dimensional integrated circuit (3D IC) has been developed with die-stacking and through-silicon via (TSV) techniques. The power supply problem is one of the essential challenges in 3D IC design because IR-drop caused by insufficient supply voltage in a 3D chip reduces the chip performance. In particular, power bumps and TSVs are placed to minimize IR-drop in a 3D power delivery network. In this paper, we propose a design methodology for 3D power delivery networks to minimize the number of power bumps and TSVs with optimum mesh structure and distribute voltage variation more uniformly by shifting the locations of power bumps and TSVs while satisfying IR-drop constraint. Simulation results show that our method can reduce the voltage variation by 29.7% on average while reducing the number of power bumps and TSVs by 76.2% and 15.4%, respectively.en_US
dc.description.sponsorshipThis research was supported by the MSIP (Ministry of Science, ICT & Future Planning), Korea, under the ITRC (Information Technology Research Center) support program supervised by the NIPA (National IT Industry Promotion Agency) (NIPA-2013-H0301-13-1011).en_US
dc.language.isoenen_US
dc.publisherELECTRONICS TELECOMMUNICATIONS RESEARCH INST, 161 KAJONG-DONG, YUSONG-GU, TAEJON 305-350, SOUTH KOREAen_US
dc.subjectThree-dimensional integrated circuiten_US
dc.subjectpower delivery networken_US
dc.subjectthrough-silicon viaen_US
dc.titleVoltage Optimization of Power Delivery Networks through Power Bump and TSV Placement in 3D ICsen_US
dc.typeArticleen_US
dc.relation.volume36-
dc.identifier.doi10.4218/etrij.14.0113.1233-
dc.relation.page642-652-
dc.relation.journalETRI JOURNAL-
dc.contributor.googleauthorJang, Cheol-Jon-
dc.contributor.googleauthorChong, Jong-wha-
dc.relation.code2014029126-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidjchong-
dc.identifier.researcherID7102639995-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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