Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 윤태현 | - |
dc.date.accessioned | 2018-03-15T01:44:04Z | - |
dc.date.available | 2018-03-15T01:44:04Z | - |
dc.date.issued | 2016-04 | - |
dc.identifier.citation | SCIENTIFIC REPORTS, v. 6, Page. 24488-24496 | en_US |
dc.identifier.issn | 2045-2322 | - |
dc.identifier.uri | https://www.nature.com/articles/srep24488 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/46965 | - |
dc.description.abstract | For the structural characterization of the polystyrene (PS)-based photonic crystals (PCs), fast and direct imaging capabilities of full field transmission X-ray microscopy (TXM) were demonstrated at soft X-ray energy. PS-based PCs were prepared on an O-2-plasma treated Si3N4 window and their local structures and defects were investigated using this label-free TXM technique with an image acquisition speed of similar to 10 sec/frame and marginal radiation damage. Micro-domains of face-centered cubic (FCC (111)) and hexagonal close-packed (HCP (0001)) structures were dominantly found in PS-based PCs, while point and line defects, FCC (100), and 12-fold symmetry structures were also identified as minor components. Additionally, in situ observation capability for hydrated samples and 3D tomographic reconstruction of TXM images were also demonstrated. This soft X-ray full field TXM technique with faster image acquisition speed, in situ observation, and 3D tomography capability can be complementally used with the other X-ray microscopic techniques (i.e., scanning transmission X-ray microscopy, STXM) as well as conventional characterization methods (e.g., electron microscopic and optical/fluorescence microscopic techniques) for clearer structure identification of self-assembled PCs and better understanding of the relationship between their structures and resultant optical properties. | en_US |
dc.description.sponsorship | This research was supported by the Basic Science Research Program (NRF-2012R1A1A2009505) through the National Research Foundation of Korea (NRF) funded by the Korea government Ministry of Science, ICT and Future Planning (MSIP). In addition, this work was also partially supported by the Industrial Strategic Technology Development Program, (Grant No. 10043929) funded By the Ministry of Trade, Industry & Energy (MOTIE, Republic of Korea) and MSIP and PAL, XFEL project, Republic of Korea. We would like to thank to Dr. Jun Lim and Soyeong Park (Pohang Accelerator Laboratory and Department of Physics, POSTECH, Pohang) for the setup/optimization of TXM, Jin Bae Kim and Nuri Yang (Hanyang University, Seoul) for their help in TXM measurement and H. K. My (Hanyang University, Seoul) for her proofread of revised manuscript. | en_US |
dc.language.iso | en | en_US |
dc.publisher | NATURE PUBLISHING GROUP | en_US |
dc.subject | COLLOIDAL CRYSTALS | en_US |
dc.subject | THICKNESS | en_US |
dc.subject | FIBERS | en_US |
dc.title | Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy | en_US |
dc.type | Article | en_US |
dc.relation.volume | 6 | - |
dc.identifier.doi | 10.1038/srep24488 | - |
dc.relation.page | 24488-24496 | - |
dc.relation.journal | SCIENTIFIC REPORTS | - |
dc.contributor.googleauthor | Nho, Hyun Woo | - |
dc.contributor.googleauthor | Kalegowda, Yogesh | - |
dc.contributor.googleauthor | Shin, Hyun-Joon | - |
dc.contributor.googleauthor | Yoon, Tae Hyun | - |
dc.relation.code | 2016012537 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF NATURAL SCIENCES[S] | - |
dc.sector.department | DEPARTMENT OF CHEMISTRY | - |
dc.identifier.pid | taeyoon | - |
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