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dc.contributor.author김찬형-
dc.date.accessioned2018-03-12T04:03:51Z-
dc.date.available2018-03-12T04:03:51Z-
dc.date.issued2013-12-
dc.identifier.citationJournal of Instrumentation, Vol.8, No.12 [2013], p1-8en_US
dc.identifier.issn1748-0221-
dc.identifier.urihttp://iopscience.iop.org/article/10.1088/1748-0221/8/12/P12011/meta-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/45236-
dc.description.abstractIndustrial single photon emission computed tomography (SPECT) is a promising technique to determine the dynamic behavior of industrial process media and has been developed in the Korea Atomic Energy Research Institute. The present study evaluated the influence of a void, which is presence in multiphase reactors of industrial process, on the image quality of an industrial SPECT. The results are very encouraging; that is, the performance of the industrial SPECT system is little influenced by the presence of a void, which means that industrial SPECT is an appropriate tool to estimate the dynamic characteristics of the process media in a water-air phase bubble column with a static gas sparger.en_US
dc.description.sponsorshipThis work was supported by the Korean Ministry of Education, Science, and Technology—Grant funded by the Korean government (the Korean Ministry of Education, Science, and Technology –NRF-2012M2A2A6007040).en_US
dc.language.isoenen_US
dc.publisherIOP PUBLISHING LTD, TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLANDen_US
dc.subjectGamma cameraen_US
dc.subjectSPECTen_US
dc.subjectPET PET/CTen_US
dc.subjectcoronary CT angiography (CTA)en_US
dc.subjectInspection with gamma raysen_US
dc.titleInfluence of void on image quality of industrial SPECTen_US
dc.typeArticleen_US
dc.relation.volume8-
dc.identifier.doi10.1088/1748-0221/8/12/P12011-
dc.relation.page1-11-
dc.relation.journalJOURNAL OF INSTRUMENTATION-
dc.contributor.googleauthorPark, J.G.-
dc.contributor.googleauthorJung, S.H.-
dc.contributor.googleauthorKim, J.B.-
dc.contributor.googleauthorMoon, J.-
dc.contributor.googleauthorKim, C.H.-
dc.relation.code2013004952-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF NUCLEAR ENGINEERING-
dc.identifier.pidchkim-
dc.identifier.researcherID8071343400-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > NUCLEAR ENGINEERING(원자력공학과) > Articles
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