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dc.contributor.author윤동원-
dc.date.accessioned2018-03-12T03:43:52Z-
dc.date.available2018-03-12T03:43:52Z-
dc.date.issued2013-12-
dc.identifier.citationIEEE Communications Letters, Vol.17, No.12 [2013], p2213-2216en_US
dc.identifier.issn1089-7798-
dc.identifier.urihttp://ieeexplore.ieee.org/document/6656078/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/45218-
dc.description.abstractIn this letter, we derive an exact and general closed-form expression for the bit error rate (BER) of Gray coded M-ary phase shift keying (MPSK) in the presence of a fixed phase error. We also propose a very simple and tight approximate expression from the derived exact expression. To validate the exactness of the proposed exact and general expression and the tightness of the proposed approximation, we compare the results obtained from the proposed expressions with those from computer simulations. We also present the average BER results of MPSK for random phase errors caused by phase-locked loop or imperfect channel estimation by using the derived expressions.en_US
dc.description.sponsorshipThis research was partially supported by the MKE, Korea, under the CITRC support program (NIPA-2013-H0401-13-1008) supervised by the NIPA.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectBit error rateen_US
dc.subjectphase shift keyingen_US
dc.subjectphase erroren_US
dc.subjectM-ARY PSKen_US
dc.subjectPROBABILITYen_US
dc.subjectCOMPUTATIONen_US
dc.subjectRAYLEIGHen_US
dc.titleGeneralized BER Expression of MPSK in the Presence of Phase Erroren_US
dc.typeArticleen_US
dc.relation.no12-
dc.relation.volume17-
dc.identifier.doi10.1109/LCOMM.2013.102913.131514-
dc.relation.page2213-2216-
dc.relation.journalIEEE COMMUNICATIONS LETTERS-
dc.contributor.googleauthorJ, Yeon-Soo-
dc.contributor.googleauthorY, Dong-Weon-
dc.contributor.googleauthorL, Sang-Kon-
dc.relation.code2013010137-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.piddwyoon-
dc.identifier.researcherID15926588800-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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