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dc.contributor.author송윤흡-
dc.date.accessioned2018-03-12T02:39:38Z-
dc.date.available2018-03-12T02:39:38Z-
dc.date.issued2016-04-
dc.identifier.citationMICROMACHINES, v. 7, NO 5, Page. 1-9en_US
dc.identifier.issn2072-666X-
dc.identifier.urihttp://www.mdpi.com/2072-666X/7/5/76-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/45170-
dc.description.abstractThis paper presents a process for the fabrication of vacuum-sealed capacitive micromachined ultrasonic transducer (CMUT) arrays using glass reflow and anodic bonding techniques. Silicon through-wafer interconnects have been investigated by the glass reflow process. Then, the patterned silicon-glass reflow wafer is anodically bonded to an SOI (silicon-on-insulator) wafer for the fabrication of CMUT devices. The CMUT 5 x 5 array has been successfully fabricated. The resonant frequency of the CMUT array with a one-cell radius of 100 mu m and sensing gap of 3.2 mu m (distance between top and bottom electrodes) is observed at 2.84 MHz. The Q factor is approximately 1300 at pressure of 0.01 Pa.en_US
dc.description.sponsorshipPart of this work was performed in the Micro/Nanomachining Research Education Center (MNC) of Tohoku University. This work was supported by Special Coordination Funds for Promoting Science and Technology, Formation of Innovation Center for Fusion of Advanced Technologies.en_US
dc.language.isoenen_US
dc.publisherMDPI AGen_US
dc.subjectcapacitive micromachined ultrasonic transduceren_US
dc.subjectglass reflow processen_US
dc.subjectanodic bondingen_US
dc.subjectmedical imagingen_US
dc.subjectnon-destructive measurementen_US
dc.subjectchemical sensingen_US
dc.titleFabrication of Vacuum-Sealed Capacitive Micromachined Ultrasonic Transducer Arrays Using Glass Reflow Processen_US
dc.typeArticleen_US
dc.relation.no5-
dc.relation.volume7-
dc.identifier.doi10.3390/mi7050076-
dc.relation.page1-9-
dc.relation.journalMICROMACHINES-
dc.contributor.googleauthorToan, Nguyen Van-
dc.contributor.googleauthorHahng, Shim-
dc.contributor.googleauthorSong, Yunheub-
dc.contributor.googleauthorOno, Takahito-
dc.relation.code2016009938-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidyhsong2008-


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