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dc.contributor.author정제창-
dc.date.accessioned2018-03-11T06:23:32Z-
dc.date.available2018-03-11T06:23:32Z-
dc.date.issued2013-04-
dc.identifier.citationJOURNAL OF ELECTRONIC IMAGING 권: 22 호: 2en_US
dc.identifier.issn1017-9909-
dc.identifier.urihttp://dx.doi.org/10.1117/1.JEI.22.2.023003-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/44989-
dc.description.abstractOur purpose is to present an intrafield deinterlacing method using the Bayes classifier. The conventional intrafield deinterlacing methods interpolate the pixel along the local edge direction, but they yield interpolation errors when the local edge direction is determined to be wrong. On the basis of the Bayes classifier, the proposed algorithm performs region-based deinterlacing. The proposed algorithm utilizes an input feature vector that includes five directional correlations, which are used to extract the characteristics of the local region, to classify the local region. After the classification of the local region, one of the three simple interpolation methods, which possesses the highest probability to be used among the three, is chosen for the corresponding local region. In addition, we categorized the range of the feature vector to reduce the computational complexity. Simulation results show that the proposed Bayes classifier-based deinterlacing method minimizes interpolation errors. Compared to the traditional deinterlacing methods and Wiener filter-based interpolation method, the proposed method improves the subjective quality of the reconstructed image, and maintains a higher peak signal-to-noise ratio level. (c) 2013 SPIE and IS&Ten_US
dc.description.sponsorshipIncheon National University Research Granten_US
dc.language.isoenen_US
dc.publisherIS&T & SPIE, 1000 20TH STen_US
dc.subjectDEINTERLACING ALGORITHen_US
dc.subjectIMAGEen_US
dc.subjectMOTIONen_US
dc.subjectDIRECTIONen_US
dc.titleInterpolation scheme based on the Bayes classifieren_US
dc.typeArticleen_US
dc.relation.no2-
dc.relation.volume22-
dc.identifier.doi10.1117/1.JEI.22.2.023003-
dc.relation.page30031-30039-
dc.relation.journalJOURNAL OF ELECTRONIC IMAGING-
dc.contributor.googleauthorPark, Sang-Jun-
dc.contributor.googleauthorJeon, Gwanggil-
dc.contributor.googleauthorWu, Jiaji-
dc.contributor.googleauthorJeong, Jechang-
dc.relation.code2013004692-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidjjeong-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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