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dc.contributor.author정용재-
dc.date.accessioned2018-03-10T04:13:45Z-
dc.date.available2018-03-10T04:13:45Z-
dc.date.issued2013-10-
dc.identifier.citationThin Solid Films, 2013, 544, P.541-544en_US
dc.identifier.issn0040-6090-
dc.identifier.urihttps://ac.els-cdn.com/S004060901201752X/1-s2.0-S004060901201752X-main.pdf?_tid=017b4558-55d1-4b8e-b9ed-b4b6d0968893&acdnat=1520510221_91bceb33a83b977da415c83ea9130029-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/44640-
dc.description.abstractDensity functional theory was used to investigate the electrostatic effect of various oxygen impurities at the interface of MgO/Ag, including interstitial oxygen defects, substitutional oxygen defects, and reconstructed substitutional oxygen defects. When interstitial and reconstructed substitutional oxygen impurities were generated at the interface, an additional bond with the film was formed and the work function of the interface increased. On the other hand, in the case of substitutional oxygen generated at the interface, the oxygen impurities migrated into the Ag subinterface layer and the work function of the interface was slightly decreased. It can be inferred that the origin of the work function change is the dipole moment induced by oxygen impurities. The results of this study indicate that the work function of MgO/Ag (001) can be finely tuned with interfacial oxygen impurities. (C) 2012 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipThis work was supported by the National Research Foundation (NRF) grant funded by the Korean government (MEST) (No. 2012-0016945), the project of Global PhD Fellowship conducted by the National Research Foundation (NRF) in 2011, and the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (No. 2012-0026175).en_US
dc.language.isoenen_US
dc.publisherElsevier Science B.V., Amsterdam.en_US
dc.subjectMgO/Agen_US
dc.subjectWork functionen_US
dc.subjectInterface defecten_US
dc.subjectOxygen impurityen_US
dc.subjectAG/MGO(001) INTERFACEen_US
dc.subjectOXIDE-FILMSen_US
dc.subjectMGO/AG(100)en_US
dc.subjectMOLECULEen_US
dc.subjectAG(001)en_US
dc.subjectGROWTHen_US
dc.subjectMETALSen_US
dc.titleWork function tuning of an ultrathin MgO film on an Ag substrate by generating oxygen impurities at the interfaceen_US
dc.typeArticleen_US
dc.relation.volume544-
dc.identifier.doi10.1016/j.tsf.2012.12.072-
dc.relation.page541-544-
dc.relation.journalTHIN SOLID FILMS-
dc.contributor.googleauthorCho, Sung Beom-
dc.contributor.googleauthorYun, Kyung-Han-
dc.contributor.googleauthorYoo, Dong Su-
dc.contributor.googleauthorAhn, Kiyong-
dc.contributor.googleauthorChung, Yong-Chae-
dc.relation.code2013012183-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidyongchae-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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