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dc.contributor.author송윤흡-
dc.date.accessioned2018-03-09T06:06:29Z-
dc.date.available2018-03-09T06:06:29Z-
dc.date.issued2013-07-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS 권: 52 호: 7 부: 1en_US
dc.identifier.issn0021-4922-
dc.identifier.urihttp://dx.doi.org/10.7567/JJAP.52.071801-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/44241-
dc.description.abstractWe proposed a novel bidirectional two-terminal selective device for realizing a 4F(2) cell size for spin-transfer-torque magnetoresistance random access memory (STT-MRAM). The proposed switching device is composed of a Schottky-barrier contact and a PN junction with a metal-semiconductor-semiconductor (M/S/S) structure. The proposed M/S/S switching device provides a current density of over 10(6) A/cm(2), which is sufficient to write the magnetic tunnel junction (MTJ), and a bilateral current flow using a punch through with an extended depletion region at a junction. Furthermore, we investigated its switching characteristics by comparing parameters such as doping profile and junction length. From this work, it is expected that an M/S/S structure will be a promising switching device for STT MRAM. (C) 2013 The Japan Society of Applied Physicsen_US
dc.description.sponsorshipMinistry of Knowledge Economy (MKE), Korea, under the Information Technology Research Center (ITRC) support programen_US
dc.language.isoenen_US
dc.publisherIOP PUBLISHING LTD, TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLANDen_US
dc.subjectMAGNETIC TUNNEL-JUNCTIONSen_US
dc.subjectTRANSISTORSen_US
dc.subjectCHANNELen_US
dc.subjectARRAYen_US
dc.titleBidirectional Two-Terminal Switching Device with Metal-Semiconductor-Semiconductor Structures for 4F(2) Spin-Transfer-Torque Magnetoresistance Random Access Memory Cellen_US
dc.typeArticleen_US
dc.relation.no071801-
dc.relation.volume52-
dc.identifier.doi10.7567/JJAP.52.071801-
dc.relation.page1-5-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.contributor.googleauthorKil, Gyu-Hyun-
dc.contributor.googleauthorSong, Yun-Heub-
dc.relation.code2013010434-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidyhsong2008-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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