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dc.contributor.author최재훈-
dc.date.accessioned2018-03-06T04:18:03Z-
dc.date.available2018-03-06T04:18:03Z-
dc.date.issued2012-12-
dc.identifier.citationJournal of Electromagnetic Engineering and Sciencem 12, 4, 240-246en_US
dc.identifier.issn2234-8409-
dc.identifier.urihttp://www.koreascience.or.kr/article/ArticleFullRecord.jsp?cn=E1ELAT_2012_v12n4_240-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/42874-
dc.description.abstractThis paper presents a novel modeling technique for traces that cross a defected ground structure. A simple and accurate equivalent circuit model provides clear insight into the coupling mechanism between a microstrip line and a slot or split. The circuit models consist of a transformer as the coupling mechanism and LC resonators as the ground with a slot or split structure. Resistors, capacitors, and inductors are added to the model to increase accuracy and equivalence at high frequency. Simulated and measured S-parameters are presented for defected ground structures. The accuracy and validity of the proposed equivalent circuit model is verified by evaluation of the S-parameter characteristics of the defected ground structures and comparison with measured results.en_US
dc.language.isoenen_US
dc.publisherThe Korean Institute of Electromagnetic Engineering and Scienceen_US
dc.subjectCircuit modelen_US
dc.subjectDefected ground structureen_US
dc.subjectDGSen_US
dc.subjectDefected Ground Structure (DGS).en_US
dc.titleCircuit Model Analysis for Traces that Cross a DGSen_US
dc.typeArticleen_US
dc.relation.no4-
dc.relation.volume12-
dc.identifier.doi10.5515/JKIEES.2012.12.4.240-
dc.relation.page240-246-
dc.relation.journalJournal of Electromagnetic Engineering and Science-
dc.contributor.googleauthorJung, Kibum-
dc.contributor.googleauthorLee, Jongkyung-
dc.contributor.googleauthorChung, Yeon-Choon-
dc.contributor.googleauthorChoi, Jae-Hoon-
dc.relation.code2012285610-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidchoijh-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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