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dc.contributor.author김태환-
dc.date.accessioned2018-02-19T06:45:18Z-
dc.date.available2018-02-19T06:45:18Z-
dc.date.issued2011-10-
dc.identifier.citationAPPLIED PHYSICS LETTERS, 99, 16, 161908en_US
dc.identifier.issn0003-6951-
dc.identifier.urihttp://aip.scitation.org/doi/abs/10.1063/1.3655197-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/38116-
dc.description.abstractThin film transistors (TFTs) utilizing TiInZnO (TIZO) channel layers with different Ti molar ratios were fabricated by using a solution process. X-ray photoelectron spectroscopy spectra for the TIZO film exhibited that the Ti 2p(1/2) peak intensity increased with increasing Ti molar ratio. The addition of the Ti atoms in the TIZO films changed their carrier concentration due to the decrease of O(2-) ions, resulting in a positive shift of the threshold voltage and in a decrease of the off-current. The on/off current ratio of the TFTs with a 10% Ti molar ratio was as large as 0.21 x 10(7). (C) 2011 American Institute of Physics. [doi: 10.1063/1.3655197]en_US
dc.description.sponsorshipThis work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MEST) (No. 2010-0018877).en_US
dc.language.isoenen_US
dc.publisherAMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USAen_US
dc.subjectcarrier densityen_US
dc.subjectindium compoundsen_US
dc.subjectthin film transistorsen_US
dc.subjecttitanium compoundsen_US
dc.subjectX-ray photoelectron spectraen_US
dc.titleEffect of the Ti molar ratio on the electrical characteristics of titanium-indium-zinc-oxide thin-film transistors fabricated by using a solution processen_US
dc.typeArticleen_US
dc.relation.no16-
dc.relation.volume99-
dc.identifier.doi10.1063/1.3655197-
dc.relation.page161908-1-161908-3-
dc.relation.journalAPPLIED PHYSICS LETTERS-
dc.contributor.googleauthorChong, Ho Yong-
dc.contributor.googleauthorHan, Kyu Wan-
dc.contributor.googleauthorNo, Young Soo-
dc.contributor.googleauthorKim, Tae Whan-
dc.relation.code2011200866-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidtwk-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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