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dc.contributor.author송윤흡-
dc.date.accessioned2018-02-13T02:31:25Z-
dc.date.available2018-02-13T02:31:25Z-
dc.date.issued2011-09-
dc.identifier.citationJapanese Journal of Applied Physics, Vol.50, No.9 [2011], p95001 ~ 0950013en_US
dc.identifier.issn1347-4065-
dc.identifier.urihttp://iopscience.iop.org/article/10.1143/JJAP.50.095001/meta-
dc.description.abstractA multilevel charge storage in a multiple FePt alloy nanodot memory is investigated for the first time. It is demonstrated that the memory structure with multiple FePt nanodot layers effectively realizes a multilevel state by the adjustment of gate voltage. Metal oxide semiconductor (MOS) capacitors with four FePt nanodot layers as a floating gate are fabricated to evaluate the multilevel cell characteristic and reliability. Here, the effect of memory window for a nanodot diameter is also investigated, and it is found that a smaller dot size gives a larger window. From the results showing good endurance and retention characteristics for the multilevel states, it is expected that a multiple FePt nanodot memory using Fowler-Nordheim (FN) tunneling can be a candidate structure for the future multilevel NAND flash memory. (C) 2011 The Japan Society of Applied Physicsen_US
dc.description.sponsorshipThis work was supported by the research fund of Hanyang University (HY-2009-O). The authors would like to thank M. Murugesan, Y. L. Pei, W. C. Jung, and T. Fukushima.en_US
dc.language.isoenen_US
dc.publisherIOP PUBLISHING LTD, TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLANDen_US
dc.subjectSILICON NANOCRYSTALSen_US
dc.subjectNONVOLATILE MEMORYen_US
dc.subjectOPERATIONen_US
dc.subjectGROWTHen_US
dc.subjectOXIDEen_US
dc.subjectDOTSen_US
dc.titleMultilevel Charge Storage in a Multiple Alloy Nanodot Memoryen_US
dc.typeArticleen_US
dc.relation.no9-
dc.relation.volume50-
dc.identifier.doi10.1143/JJAP.50.095001-
dc.relation.page095001-1-095001-3-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.contributor.googleauthorLee, Gae-Hun-
dc.contributor.googleauthorLee, Jung-Min-
dc.contributor.googleauthorSong, Yun-Heub-
dc.contributor.googleauthorBea, Ji-Chel-
dc.contributor.googleauthorTanaka, Tetsu-
dc.contributor.googleauthorKoyanagi, Mitsumasa-
dc.relation.code2011217131-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidyhsong2008-
dc.identifier.researcherID36081079600-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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