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Issue DateTitleAuthor(s)
2019-05Blue Emission of alpha-GaN Colloidal Quantum Dots via Zn Doping김재균
2019-04Soliton fractional charge of disordered graphene nanoribbon차민철
2019-02Evidence for moire excitons in van der Waals heterostructures김수은
2005-12Generic superfluid-insulator transition in the spherical limit in two dimensions차민철
2005-12Rigorous coupled-wave analysis를 이용한 극자외선 리소그래피에서 그림자 효과를 줄이기 위한 마스크 변형신동수
2005-12전기광학 폴리머 도파관에 바탕한 애들이발 광변조기신동수
2005-12Quasiparticle gap in a disordered boson Hubbard model in two dimensions차민철
2005-11Superfluid-insulator transitions of two-species bosons in an optical lattice차민철
2005-10Rubbed Polyimide Layers Studied by Rotating Sample and Compensator Spectroscopic Ellipsometry안일신
2005-10A Measurement method of the resonantly enhanced gain spectrum and its effect on second harmonic generation in Vertical-External-Cavity Surface-Emitting Laser(VECSEL)심종인
2005-09Critical aspect of curing epoxy adhesive: fiber pistoning of LC connector신동수
2005-08Effect of a step barrier on the quantum-confined Stark effect and applications to electroabsorption modulators with high saturation optical power신동수
2005-08Line-Width Variation with Absorber Thickness in Extreme Ultraviolet Lithography안일신
2005-07Lens Aberration Effect on the Line Width for Different Pattern Shapes and Duty Ratios안일신
2005-06Determination of the Optical Functions of Various Liquids by Rotating Compensator Multichannel Spectroscopic Ellipsometry안일신
2005-06Bulk Effects of Thermal Flow Resists안일신
2005-06Spectroscopic Ellipsometry Studies of Thin Films Prepared by Glancing Angle Deposition안일신
2005-06Calibration-Free Multichannel Ellipsometry for Retardance Measurement안일신
2005-05Ohmic Contacts of Pd/Zn/Pt(or Pd)Au Materials to P-TYPE InP심종인
2005-05A New TWA based Efficient Signal Integrity Verification Technique for Non-Uniform RLC Interconnect Lines심종인

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