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dc.contributor.author송윤흡-
dc.date.accessioned2018-02-08T02:03:36Z-
dc.date.available2018-02-08T02:03:36Z-
dc.date.issued2011-08-
dc.identifier.citationIEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(8):1023-1025 Aug, 2011en_US
dc.identifier.issn1558-0563-
dc.identifier.issn0741-3106-
dc.identifier.urihttp://ieeexplore.ieee.org/document/5936095/?reload=true-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/36108-
dc.description.abstractWe propose a bilateral switching poly-Si junction device to realize a crossbar array with a perpendicular spin-transfer torque (STT) magnetic random access memory (MRAM). An N(+)/P/N(+) bilateral junction device with two bias terminals provides bidirectional current flow enough to write STT MRAM by a drain induced barrier lowering under a reverse bias of N(+)/P. In addition, asymmetrical doping for two N(+) terminals provides a high on-off ratio of 10(7) under read condition, which is acceptable for a crossbar array. From this work, it is expected that a bilateral poly-Si junction will be a promising switch device to achieve crossbar architecture with a perpendicular STT MRAM.en_US
dc.description.sponsorshipIEEE Electron Devices Societyen_US
dc.language.isootheren_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USAen_US
dc.subjectEngineered Materials, Dielectrics and Plasmasen_US
dc.subjectComponents, Circuits, Devices and Systemsen_US
dc.subjectJunctionsen_US
dc.subjectDopingen_US
dc.subjectSwitchesen_US
dc.subjectComputer architectureen_US
dc.subjectMicroprocessorsen_US
dc.subjectMagnetic tunnelingen_US
dc.subjectRandom access memoryen_US
dc.subjectspin-transfer torque (STT) magnetic random access memory (MRAM)en_US
dc.subjectBidirectional current writeen_US
dc.subjectcrossbar arrayen_US
dc.subjectjunction deviceen_US
dc.titleBidirectional Two-Terminal Switching Device for Crossbar Array Architectureen_US
dc.typeArticleen_US
dc.relation.no8-
dc.relation.volume32-
dc.identifier.doi10.1109/LED.2011.2157452-
dc.relation.page1023-1025-
dc.relation.journalIEEE ELECTRON DEVICE LETTERS-
dc.contributor.googleauthorPark, Seung Young-
dc.contributor.googleauthorLee, Jung Min-
dc.contributor.googleauthorYang, Hyung Jun-
dc.contributor.googleauthorKil, Gyu Hyun-
dc.contributor.googleauthorSong, Yun Heub-
dc.relation.code2011203822-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidyhsong2008-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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