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dc.contributor.author박상규-
dc.date.accessioned2017-12-11T04:51:59Z-
dc.date.available2017-12-11T04:51:59Z-
dc.date.issued2016-02-
dc.identifier.citationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 16, NO 1, Page. 23-30en_US
dc.identifier.issn1598-1657-
dc.identifier.issn2233-4866-
dc.identifier.urihttp://koreascience.or.kr/article/ArticleFullRecord.jsp?cn=E1STAN_2016_v16n1_23-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/34052-
dc.description.abstractWe report a STT-MRAM write-scheme, in which the length of the write-pulse is determined dynamically by sensing the status of MTJ cells. The proposed scheme can reduce the power consumption by eliminating unnecessary writing current after the switching has occurred. We also propose a reference cell design, which is optimized for the use in write-circuits. The performance of the proposed circuit was verified by SPICE level simulations of the circuit implemented in a 0.13 mu m CMOS process.en_US
dc.description.sponsorshipThis research was supported by the MOTIE (Ministry of Trade, Industry and Energy, 10044608) and KSRC (Korea Semiconductor Research Consortium) support program for the development for the future semiconductor device.en_US
dc.language.isoenen_US
dc.publisherIEEK PUBLICATION CENTERen_US
dc.subjectSTT-MRAMen_US
dc.subjectwrite-operationen_US
dc.subjectreference cellen_US
dc.subjectpower savingen_US
dc.titleLow-Power Write-Circuit with Status-Detection for STT-MRAMen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume16-
dc.identifier.doi10.5573/JSTS.2016.16.1.023-
dc.relation.page23-30-
dc.relation.journalJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE-
dc.contributor.googleauthorShin, Kwang-Seob-
dc.contributor.googleauthorIm, Saemin-
dc.contributor.googleauthorPark, Sang-Gyu-
dc.relation.code2016010716-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidsanggyu-
dc.identifier.orcidhttp://orcid.org/0000-0002-6051-0163-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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