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dc.contributor.author권오경-
dc.date.accessioned2017-12-07T07:09:20Z-
dc.date.available2017-12-07T07:09:20Z-
dc.date.issued2016-02-
dc.identifier.citationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v. 63, NO 6, Page. 573-577en_US
dc.identifier.issn1549-7747-
dc.identifier.issn1558-3791-
dc.identifier.urihttp://ieeexplore.ieee.org/document/7410021/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/33985-
dc.description.abstractIn this brief, a low-power two-tap voltage-mode transmitter (TX) with precisely matched output impedance using an embedded calibration circuit for dc-coupled unidirectional links is proposed. The proposed TX adopts an N-over-N driver with a supply voltage of 0.4 V in order to reduce the power consumption of the output driver. Its output driver is configured as a two-tap Finite Impulse Response (FIR) filter in order to compensate for channel loss at high frequency. In addition, the proposed embedded impedance calibration circuit precisely matches the impedance of the output driver to the channel characteristic impedance by using the receiver termination resistor instead of external reference resistors. The proposed two-tap voltage-mode TX is fabricated using a 90-nm low-power CMOS process technology and occupies an active area of 0.054 mm(2). The measurement results show that the matching error of the output impedance is between -0.6% and +0.8%, and the power efficiency is 0.75 pJ/b without equalization and 0.94 pJ/b with 6-dB equalization, at a data rate of 5.0 Gb/s.en_US
dc.description.sponsorshipThis work was supported in part by SK Hynix Semiconductor Inc. This brief was recommended by Associate Editor S. Palermo.en_US
dc.language.isoenen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectN-over-Nen_US
dc.subjectoutput impedance calibrationen_US
dc.subjecttransmitter (TX)en_US
dc.subjecttwo-tap equalizationen_US
dc.subjectvoltage-modeen_US
dc.titleA Low-Power Two-Tap Voltage-Mode Transmitter With Precisely Matched Output Impedance Using an Embedded Calibration Circuiten_US
dc.typeArticleen_US
dc.relation.no6-
dc.relation.volume63-
dc.identifier.doi10.1109/TCSII.2016.2530818-
dc.relation.page573-577-
dc.relation.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS-
dc.contributor.googleauthorKwak, Kang-Sub-
dc.contributor.googleauthorRa, Jong-Hyun-
dc.contributor.googleauthorMoon, Ho-Sung-
dc.contributor.googleauthorHong, Seong-Kwan-
dc.contributor.googleauthorKwon, Oh-Kyong-
dc.relation.code2016000229-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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