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dc.contributor.author오현옥-
dc.date.accessioned2017-04-04T07:55:40Z-
dc.date.available2017-04-04T07:55:40Z-
dc.date.issued2015-07-
dc.identifier.citationIEEE TRANSACTIONS ON COMPUTERS, v. 64, NO 7, Page. 2036-2048en_US
dc.identifier.issn0018-9340-
dc.identifier.issn1557-9956-
dc.identifier.urihttp://ieeexplore.ieee.org/abstract/document/6880324/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/26588-
dc.description.abstractWith the continuous scaling of semiconductor technology, failure rate is increasing significantly so that reliability becomes an important issue in multiprocessor system-on-chip (MPSoC) design. We propose an optimal checkpoint selection with task duplication hardening to tolerate transient faults. A target application is specified in a task graph, and the schedule/checkpoint placements are determined at design time. The proposed optimal algorithm minimizes the checkpoint overhead with a latency constraint. Experimental results show that the proposed algorithm effectively reduces the minimum end-to-end latency to perform a fault-tolerant schedule. In addition, the proposed algorithm dramatically decreases the checkpointing overhead on uniprocessor and multiprocessor systems compared with a greedy approach and an equidistant algorithm.en_US
dc.description.sponsorshipThis work was supported by the Ministry of Science, ICT & Future Planning (MSIP), Korea, under the Information Technology Research Center (ITRC) support program supervised by the National IT Industry Promotion Agency (NIPA) (NIPA-2014-H0301-14-1018), by Basic Science Research Programs through the National Research Foundation of Korea (NRF) funded by the MSIP (2013R1A1A1012715, 2013R1A1A1013384, 2013R1A2A2A01067907), by Center for Advanced Image of Chonbuk National University, and by IT R&D program MKE/KEIT (No. 10041608, Embedded system Software for New-memory based Smart Device). The ICT at Seoul National University provides research facilities for this study. The corresponding author is Hyunok Oh.en_US
dc.language.isoenen_US
dc.publisherIEEE COMPUTER SOCen_US
dc.subjectCheckpointen_US
dc.subjecttask graphen_US
dc.subjectmultiprocessoren_US
dc.subjectreliabilityen_US
dc.subjectoptimal algorithmen_US
dc.titleOptimal Checkpoint Selection with Dual-Modular Redundancy Hardeningen_US
dc.typeArticleen_US
dc.relation.no7-
dc.relation.volume64-
dc.identifier.doi10.1109/TC.2014.2349492-
dc.relation.page2036-2048-
dc.relation.journalIEEE TRANSACTIONS ON COMPUTERS-
dc.contributor.googleauthorKang, Shin-Haeng-
dc.contributor.googleauthorPark, Hae-woo-
dc.contributor.googleauthorKim, Sungchan-
dc.contributor.googleauthorOh, Hyunok-
dc.contributor.googleauthorHa, Soonhoi-
dc.relation.code2015002695-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF INFORMATION SYSTEMS-
dc.identifier.pidhoh-
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COLLEGE OF ENGINEERING[S](공과대학) > INFORMATION SYSTEMS(정보시스템학과) > Articles
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