Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권오경 | - |
dc.date.accessioned | 2016-09-02T07:19:31Z | - |
dc.date.available | 2016-09-02T07:19:31Z | - |
dc.date.issued | 2015-03 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v. 62, NO 5, Page. 451-455 | en_US |
dc.identifier.issn | 1549-7747 | - |
dc.identifier.issn | 1558-3791 | - |
dc.identifier.uri | http://ieeexplore.ieee.org/document/7001248/?arnumber=7001248&tag=1 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/22982 | - |
dc.description.abstract | This brief presents a low-power CMOS image sensor with 14-bit column-parallel two-step (TS) successive approximation (SA) analog-to-digital converters (ADCs). The proposed TS SA ADC adopts a pseudomultiple sampling method to reduce the power consumption and the area. For implementing the 14-bit ADC, it only uses a capacitor digital-to-analog converter of 6 bits rather than 14 bits. The multiple sampling also suppresses the noise of a pixel and a column-parallel ADC. The image sensor is fabricated by using the 0.13-mu m CMOS process. The measurement results show that the temporal noise is 82.7 mu V-rms, and the power consumption is 55.1 mu W for one column ADC with a programmable gain amplifier. With the digital correlated double sampling and the TS calibration method, the proposed ADC achieves the column fixed-pattern noise of 0.98 LSB and a differential non-linearity of +0.99/-0.90 LSB. | en_US |
dc.description.sponsorship | Image Frontier Center | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.subject | Column-parallel analog-to-digital (A/D) converter (ADC) | en_US |
dc.subject | digital correlated double sampling (CDS) | en_US |
dc.subject | pseudomultiple sampling (PMS) | en_US |
dc.subject | successive approximation (SA) ADC | en_US |
dc.subject | small area | en_US |
dc.title | A Low-Power CMOS Image Sensor With Area-Efficient 14-bit Two-Step SA ADCs Using Pseudomultiple Sampling Method | en_US |
dc.type | Article | en_US |
dc.relation.no | 5 | - |
dc.relation.volume | 62 | - |
dc.identifier.doi | 10.1109/TCSII.2014.2387531 | - |
dc.relation.page | 451-455 | - |
dc.relation.journal | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | - |
dc.contributor.googleauthor | Kim, Jong-Boo | - |
dc.contributor.googleauthor | Hong, Seong-Kwan | - |
dc.contributor.googleauthor | Kwon, Oh-Kyong | - |
dc.relation.code | 2015000491 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | okwon | - |
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