Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권오경 | - |
dc.date.accessioned | 2016-09-02T07:09:21Z | - |
dc.date.available | 2016-09-02T07:09:21Z | - |
dc.date.issued | 2015-03 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v. 62, NO 3, Page. 888-895 | en_US |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.issn | 1557-9646 | - |
dc.identifier.uri | http://ieeexplore.ieee.org/document/7006786/?arnumber=7006786 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/22980 | - |
dc.description.abstract | This paper presents a high-speed wafer-scale CMOS X-ray detector with an active area of 12 cm x 12 cm, which features 100 mu m-sized pixels. A horizontal row driver is adopted for implementing a three-side buttable detector with the tiling technique and thereby enabling the extension of the active area. The proposed detector employs 14-b column-parallel extended-counting analog-to-digital converters (EC ADCs) using digital correlated double sampling for high-speed operation and high-gray-scale resolution. The oversampling binning method using a Delta Sigma modulator in EC ADCs is proposed for high sensitivity and the pipelined timing method is adopted for a high frame rate, which results in reduction of the X-ray dose. An offset cancellation method for the input buffer is used to improve the uniformity between column ADCs. The proposed CMOS X-ray detector is fabricated using a 0.35-mu m CMOS process with the stitching technique. The measured differential column fixed pattern noise and random noise without X-ray exposure are 3.01 and 3.06 least significant bits, respectively, at a resolution of 14 b. In the full-resolution mode, the proposed detector operates up to a frame frequency of 108 frames/s with the pipelined timing and 60 frames/s without the pipelined timing. | en_US |
dc.description.sponsorship | Cooperative Research and Development Program Korea Research Council for Industrial Science and Technology | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.subject | CMOS X-ray detector | en_US |
dc.subject | column-parallel extended-counting analog-to-digital converter (EC ADC) | en_US |
dc.subject | oversampling binning operation | en_US |
dc.subject | pipelined timing | en_US |
dc.subject | wafer-scale sensor | en_US |
dc.title | A High-Speed Wafer-Scale CMOS X-Ray Detector With Column-Parallel ADCs Using Oversampling Binning Method | en_US |
dc.type | Article | en_US |
dc.relation.no | 3 | - |
dc.relation.volume | 62 | - |
dc.identifier.doi | 10.1109/TED.2014.2386533 | - |
dc.relation.page | 888-895 | - |
dc.relation.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.contributor.googleauthor | Kim, Jong-Boo | - |
dc.contributor.googleauthor | Hong, Seong-Kwan | - |
dc.contributor.googleauthor | Kwon, Oh-Kyong | - |
dc.relation.code | 2015002887 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | okwon | - |
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