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dc.contributor.author심종인-
dc.date.accessioned2023-07-21T02:33:21Z-
dc.date.available2023-07-21T02:33:21Z-
dc.date.issued2009-08-
dc.identifier.citationApplied Physics Letters, v. 95, NO. 8, article no. 081114, Page. 1-4-
dc.identifier.issn0003-6951;1077-3118-
dc.identifier.urihttps://aip.scitation.org/doi/10.1063/1.3216578en_US
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/184069-
dc.description.abstractEfficiency droop in InGaN light-emitting diodes (LEDs) is analyzed based on the rate equation model. By using the peak point of the efficiency versus current-density relation as the parameters of the rate equation analysis, internal quantum efficiency and each recombination current at arbitrary current density can be unambiguously determined without any knowledge of A, B, and C coefficients. The theoretical analysis is compared with measured efficiency of a LED sample and good agreement between the model and experiment is found. The investigation of recombination coefficients shows that Auger recombination alone is not sufficient to explain the efficiency droop of InGaN LEDs.-
dc.description.sponsorshipThis work was supported by Strategic Technology Development Project of the Ministry of Knowledge Economy.-
dc.languageen-
dc.publisherAmerican Institute of Physics-
dc.subjectAuger effect-
dc.subjectelectron-hole recombination-
dc.subjectgallium compounds-
dc.subjectIII-V semiconductors-
dc.subjectindium compounds-
dc.subjectlight emitting diodes-
dc.subjectwide band gap semiconductors-
dc.titleRate equation analysis of efficiency droop in InGaN light-emitting diodes-
dc.typeArticle-
dc.relation.no8-
dc.relation.volume95-
dc.identifier.doi10.1063/1.3216578-
dc.relation.page1-4-
dc.relation.journalApplied Physics Letters-
dc.contributor.googleauthorRyu, Han-Youl-
dc.contributor.googleauthorKim, Hyun-Sung-
dc.contributor.googleauthorShim, Jong-In-
dc.sector.campusE-
dc.sector.daehak과학기술융합대학-
dc.sector.department나노광전자학과-
dc.identifier.pidjishim-
dc.identifier.article081114-


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