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DC FieldValueLanguage
dc.contributor.author심종인-
dc.date.accessioned2023-07-21T00:58:56Z-
dc.date.available2023-07-21T00:58:56Z-
dc.date.issued2014-11-
dc.identifier.citationAsia Communications and Photonics Conference, ACP, article no. 8687501, Page. 1-3-
dc.identifier.issn2162-108X-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8687501?arnumber=8687501&SID=EBSCO:edseeeen_US
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/184029-
dc.description.abstractExperimental efficiency droop phenomena have been consistently explained by the saturation of the radiative recombination rate in InGaN quantum well at low current and subsequent increase in the nonradiative recombination rates at high current. ? OSA 2014-
dc.description.sponsorshipthe Industrial Strategic Technology Development Program (10041878): ‘Development of WPE 75% LED device process and standard evaluation technology’ funded by the Ministry of Trade, Economy & Energy (MOTIE), Korea.-
dc.languageen-
dc.publisherOSA - The Optical Society-
dc.titleImportance of the radiative recombination rate to efficiency droop in InGaN-based light-emitting diodes-
dc.typeArticle-
dc.identifier.doi10.1364/acpc.2014.ath4i.2-
dc.relation.page1-3-
dc.relation.journalAsia Communications and Photonics Conference, ACP-
dc.contributor.googleauthorShim, Jong-In-
dc.contributor.googleauthorKim, Hyunsung-
dc.contributor.googleauthorShin, Dong Soo-
dc.sector.campusE-
dc.sector.daehak과학기술융합대학-
dc.sector.department나노광전자학과-
dc.identifier.pidjishim-
dc.identifier.article8687501-


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