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dc.contributor.author신동수-
dc.date.accessioned2023-06-01T01:16:47Z-
dc.date.available2023-06-01T01:16:47Z-
dc.date.issued2018-07-
dc.identifier.citationIEEE Photonics Technology Letters, v. 30, NO. 13, Page. 1183-1185-
dc.identifier.issn1041-1135;1941-0174-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8361021en_US
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/181855-
dc.description.abstractWe characterize the degradation of organic light-emitting diodes (OLEDs) by employing the impedance spectroscopy. An integrated OLED is compared with the hole only device (HOD) and the electron-only device to understand the degradation mechanism under voltage stress for 12 h in ambient conditions. Changes in impedance observed from the Cole-Cole plot of the HOD reveal that the degradation mechanism of the OLED is attributed to unbalanced recombination resulting from the deterioration of hole injection into the emissive layer.-
dc.description.sponsorshipSamsung Display.-
dc.languageen-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.subjectOrganic light-emitting diodes-
dc.subjectimpedance spectroscopy-
dc.subjectdegradation-
dc.titleInvestigation of Luminance Degradation in Organic Light-Emitting Diodes by Impedance Spectroscopy-
dc.typeArticle-
dc.relation.no13-
dc.relation.volume30-
dc.identifier.doi10.1109/LPT.2018.2838099-
dc.relation.page1183-1185-
dc.relation.journalIEEE Photonics Technology Letters-
dc.contributor.googleauthorShin, Dong-Soo-
dc.contributor.googleauthorLee, Gyeong Won-
dc.contributor.googleauthorKim, Heejin-
dc.contributor.googleauthorPark, Jongwoo-
dc.contributor.googleauthorShim, Jong-In-
dc.sector.campusE-
dc.sector.daehak과학기술융합대학-
dc.sector.department나노광전자학과-
dc.identifier.piddshin-


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