Optical properties of the different tapered silicon nanowires based on KK relation

Abstract

The optical properties of the various types of tapered silicon nanowires (SiNWs) have been investigated by the phase retrieving method of utilizing the experimental reflection spectra with the aid of the Kramers-Kronig (KK) relation. The effective refractive index (n) and the extinction coefficient (K) of each tapered SiNWs and combined silicon nanowires and microwires (CNMW) array samples can be obtained from concrete simulation by the KK relation. At the same time, we can also obtain the real part (epsilon') and imaginary part (epsilon") of the effective complex dielectric constant from the relation between the refractive index and the complex dielectric constant of samples. And the simulated results show that the relative material parameters (effective complex refractive index, effective complex dielectric function) can be modulated from a concrete material processing.